NSG 3040
THE SMART 4 KV SOLUTION FORCE APPLICATIONS
Teseq’s new NSG 3040 is an easy-to-use multifunction generator that simulates electromagnetic interference effects for immunity
testing in conformity with international, national, and
manufacturers’ standards including the latest IEC/EN standards.
The NSG 3040 system is designed to fulfill conducted EMC test
requirements for CE mark testing, including Combination Wave Surge (4.4 kV), Electrical Fast
Transient (EFT) pulses (4.8 kV), and Power Quality Testing (PQT).
Expansion capabilities enable the system to be configured for a
much broader range of applications including Telecom Surge 10/700
and Magnetic Field tests.
Featuring an innovative modular design, the NSG 3040 is a versatile system that can be configured for
basic testing needs and expanded to meet the needs of sophisticated
test laboratories.
Teseq’s well-proven “Master-Slave” architecture enables individual
pulse modules to be calibrated separately, with calibration data
and correction factors stored on the slave controller. New modules
can be easily installed with no need to return the entire system
for calibration.
The NSG 3040 integrates a high-quality 7-inch large color touchscreen display with excellent contrast, making controlling the NSG 3040 simple.
Upon request, the integrated keyboard supports the use of a wheel
with additional keys for input or sensitivity adjustment. The value
of each parameter is clear, and all Settings can be quickly selected and modified with a large touch input button. The ramp function can be programmed quickly and easily without a stylus.
Multi-step test procedures can be created and their sequence or
parameter values changed easily. Firmware downloads can be
performed quickly with the easily accessible SD memory card reader. Tests specified by the user will be saved completely.
The NSG 3040 has an Ethernet port for external PC control.
Combination wave pulse 1, 2/50 – 8/20 µs (Hybrid-Surge pulse)
Pulse conforms to IEC/EN 61000-4-5
| Parameter | Value |
|---|
| Pulse voltage (open circuit) | ±200 V to 4.4 kV (in 1 V steps) |
| Pulse current (short circuit) | ±100 A to 2.2 kA |
| Impedance | 2/12 O |
| Polarity | positive / negative / alternate |
| Pulse repetition | 10 s, up to 600 s (in 1 s steps) |
| Test duration | 1 to 9999 pulses, continuous |
| Phase synchronization | asynchronous, synchronous 0 to 359º (in 1º steps) |
| Coupling | external / internal |
Burst (EFT) 5/50 ns
Pulse conforms to IEC/EN 61000-4-4
| Parameter | Value |
|---|
| Pulse amplitude | ±200 V to 4.8 kV (in 1 V steps) – open circuit
±100 V to 2.4 kV (50 O matching system) |
| Burst frequency | 100 Hz to 1000 kHz |
| Polarity | positive / negative / alternate |
| Repetition time | 1 ms to 4200 s (70 min) |
| Burst time | 1 µs to 1999 s, single pulse, continuous |
| Test duration | 1 s to 1000 h |
| Phase synchronization | asynchronous, synchronous 0 to 359º (in 1º steps) |
| Coupling | external / internal |
Dips, Interrupts & Variations
Conforms to IEC/EN 61000-4-11, IEC/EN 61000-4-29
| Parameter | Value |
|---|
| Dips, Interrupts & Variations | From EUT voltage input to 0 V, 0% |
| Uvar with optional variac | depending on model (VAR 3005) |
| Uvar with step transformer | 0, 40, 70, 80% (INA 650x) |
| Peak inrush current capability | 500 A (at 230 V) |
| Switching times | 1 to 5 µs (100 O load) |
| Event time | 20 µs to 1999 s, 1 to 300 cycles or 1 to 3’000 1/10 cycles |
| Test duration | 1 s to 70’000 min, 1 to 99’999 events, continuous |
| Repetition time | 40 µs to 35 min, 1 to 99’999 cycles |
| Phase synchronization | asynchronous, synchronous 0 to 359º (in 1º steps)
|
NSG 3040 - the smart 4 kV solution for CE applications
