Test Sphere Probe A HT-I01 For Anti-Electric Shock Test

Test Sphere Probe HT-I01

Standard:IEC61032 fig.1, IEC60529 IP1 and IEC60065.

Application:This probe is intended to verify protection the back of hand of persons against access to hazardous parts.

It is also the necessary probe used to prevent the hazardous parts and solid foreign objects from entering.

Test sample:Easily accessible enclosure live parts or mechanical parts.

Feature:This test probe can be customized. It can be used for anti-electric shock test when equipped with amphenol connector.

Or used for enclosure protection test when open threaded hole of M6 at the end of the handle (connected with pull and push dynamometer) .

The probe whose model number is with "T" is with force.

Parameters:

Shanghai kerang technology co., ltd is located in Shanghai City, China, and was established in 2018.It is a company specializing in the field of automation technology: technology development, technology transfer, technical consultation and technical service; installation, design, commissioning and maintenance of automation equipment; and other high-tech enterprises. And have strong R & D capabilities in the field of test instrument industry. The testing equipment developed by the company is widely used in many industries such as electronics, home appliances, etc.

We have strong technical reserves and solid technical strength, especially in the field of environmental testing equipment or product online monitoring. The newly developed products are used in aerospace, aerospace, nuclear industry and other projects.

Looking forward to your inquiry and negotiation.