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Brand Name : | HongCe |
Model Number : | HT-I23 |
Certification : | Third part calibration certificate(cost additional) |
Price : | Negotiatable |
Payment Terms : | T/T |
Supply Ability : | 100 set/ month |
Delivery Time : | 3 Days |
IEC 62368-1 Figure V.3 Test Finger Probe Telecom Test Probe With IEC60950 Figure 2C
Standard description(IEC 62151 4.2.2.1):
4.2.2.1 Accessibility
The equipment shall be so constructed that in USER ACCESS AREAS
there is adequate protection against contact with bare parts of TNV
- 1 , TNV - 2 and
TNV - 3 CIRCUITS except that access is permitted to: Test Finger Probe
– contacts of connectors which cannot be touched by the test probe
(figure 3);
– bare conductive parts in the interior of a battery compartment
that complies with 4.2.2.2;
– bare conductive parts of TNV - 1
CIRCUITS that are connected to a PROTECTIVE EARTHING terminal;
In SERVICE ACCESS AREAS , no requirement is specified regarding
access to TNV - 1 , TNV - 2 or TNV - 3 CIRCUITS , however HAZARDOUS
- LIVE - PARTS shall be located or guarded so that unintentional
bridging by conductive materials that might be present is unlikely.
Test Finger Probe
Any guards required for compliance with 4.2.2.1 shall be easily
removable and replaceable if removal is necessary for service.
In RESTRICTED ACCESS LOCATIONS no requirement is specified egarding
access to TNV - 1 , TNV - 2 or TNV - 3 CIRCUITS .
However, HAZARDOUS - LIVE - PARTS shall be located or guarded so
that accidental shorting to TNV CIRCUITS , for example by TOOLS or
test probes used by SERVICE PERSONNEL , is unlikely. Any guards
required for ompliance with 4.2.2.1 shall be easily removable and
replaceable if removal is necessary for service. Test Finger Probe
Compliance is checked by inspection, by measurement and by means of
the test finger (IEC 61032, test probe B) applied as specified in
the compliance section of the relevant equipment standard), and the
test probe, figure 3.
Standard:IEC 62368-1:2018 clause 5.3.2 and Figure V.3, IEC60950 figure 2C, IEC60065:2014 Annex B, Test Probe. According IEC 62151 Figure 3 and UL6500 figure B.1.
Application:It is used for the bare parts of TNV circuits of information technology equipment to see whether they have sufficient protection.
Test sample:Information technology equipment.
Feature:Nylon handle + stainless steel probe.
Parameters:
Model | HT-I23 |
Probe length | 80 |
End radius | R6 |
Probe diameter | Φ12 |
Baffle diameter of the handle | 50 |
Picture for reference:
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Company Info. |
Guangzhou HongCe Equipment Co., Ltd. |
Verified Supplier |
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