Low Temperature Impact Test Device LTI-1 IEC60884 Use With Cryostat

Low-temperature impact test device LTI-1

Product information:

The HT Apparatus for impact test at low temperature confirms to the standard of IEC60884 figure 27 and figure 42. The first one is fit for impact test of wire while the latter one is applied for the impact test of plug, socket, switch, wire and electrical conduit.

Technical parameters:

This device is used with the cryostat. It should be put in the sponge-rubber pad of 40mm-thickness.

The height of falling: 10~250mm is adjustable.

For the samples of laying of cable, the weight of the drop hammer required are as follows:

For the samples of flexible cable and telecommunication cable, the weight of the drop hammer required is as follows:

Shanghai kerang technology co., ltd is located in Shanghai City, China, and was established in 2018.It is a company specializing in the field of automation technology: technology development, technology transfer, technical consultation and technical service; installation, design, commissioning and maintenance of automation equipment; and other high-tech enterprises. And have strong R & D capabilities in the field of test instrument industry. The testing equipment developed by the company is widely used in many industries such as electronics, home appliances, etc.

We have strong technical reserves and solid technical strength, especially in the field of environmental testing equipment or product online monitoring. The newly developed products are used in aerospace, aerospace, nuclear industry and other projects.

Looking forward to your inquiry and negotiation.