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Semi-Insulating ,GaAs Substrate With High Mobility , 2”,Prime Grade,Epi Ready

    Buy cheap Semi-Insulating ,GaAs Substrate With High Mobility , 2”,Prime Grade,Epi Ready from wholesalers
     
    Buy cheap Semi-Insulating ,GaAs Substrate With High Mobility , 2”,Prime Grade,Epi Ready from wholesalers
    • Buy cheap Semi-Insulating ,GaAs Substrate With High Mobility , 2”,Prime Grade,Epi Ready from wholesalers

    Semi-Insulating ,GaAs Substrate With High Mobility , 2”,Prime Grade,Epi Ready

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    Brand Name : PAM-XIAMEN
    Payment Terms : T/T
    Supply Ability : 10,000 wafers/month
    Delivery Time : 5-50 working days
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    Semi-Insulating ,GaAs Substrate With High Mobility , 2”,Prime Grade,Epi Ready

    Semi-Insulating ,GaAs Substrate With High Mobility , 2”,Prime Grade,Epi Ready


    PAM-XIAMEN provides both single crystal and polycrystalline GaAs wafer ( Gallium Arsenide ) for opto-electronics and micro-electronics industry for making LD , LED , microwave circuit and solar cell applications , the wafers is in diameter range from 2" to 6" in various thicknesses and orientations. We offer single crystal GaAs wafer produced by two main growth techniques LEC and VGF method , allowing us to provide customers the widest choice of GaAs material with high uniformity of electrical properties and excellent surface quality . Gallium Arsenide can be supplied as ingots and polished wafer, both conducting and semi-insulating GaAs wafer , mechanical grade and epi ready grade are all available . We can offer GaAs wafer with low EPD value and high surface quality suitable for your MOCVD and MBE applications. PAM-XIAMEN can produce wide range grades: prime grade, test grade, and optical grade. Please contact our engineer team for more wafer information.


    (GaAs)Gallium Arsenide Wafers,Semi-insulating for Microelectronics Applications

    ItemSpecificationsRemarks
    Conduction TypeInsulating
    Growth MethodVGF
    DopantUndoped
    Wafer Diamter2, inchIngot available
    Crystal Orientation(100)+/- 0.5°
    OFEJ, US or notch
    Carrier Concentrationn/a
    Resistivity at RT>1E7 Ohm.cm
    Mobility>5000 cm2/V.sec
    Etch Pit Density<8000 /cm2
    Laser Markingupon request
    Surface FinishP/P
    Thickness350~675um
    Epitaxy ReadyYes
    PackageSingle wafer container or cassette

    Properties of GaAs Crystal

    PropertiesGaAs
    Atoms/cm34.42 x 1022
    Atomic Weight144.63
    Breakdown Fieldapprox. 4 x 105
    Crystal StructureZincblende
    Density (g/cm3)5.32
    Dielectric Constant13.1
    Effective Density of States in the Conduction Band, Nc (cm-3)4.7 x 1017
    Effective Density of States in the Valence Band, Nv (cm-3)7.0 x 1018
    Electron Affinity (V)4.07
    Energy Gap at 300K (eV)1.424
    Intrinsic Carrier Concentration (cm-3)1.79 x 106
    Intrinsic Debye Length (microns)2250
    Intrinsic Resistivity (ohm-cm)108
    Lattice Constant (angstroms)5.6533
    Linear Coefficient of Thermal Expansion,6.86 x 10-6
    ΔL/L/ΔT (1/deg C)
    Melting Point (deg C)1238
    Minority Carrier Lifetime (s)approx. 10-8
    Mobility (Drift)8500
    (cm2/V-s)
    µn, electrons
    Mobility (Drift)400
    (cm2/V-s)
    µp, holes
    Optical Phonon Energy (eV)0.035
    Phonon Mean Free Path (angstroms)58
    Specific Heat0.35
    (J/g-deg C)
    Thermal Conductivity at 300 K0.46
    (W/cm-degC)
    Thermal Diffusivity (cm2/sec)0.24
    Vapor Pressure (Pa)100 at 1050 deg C;
    1 at 900 deg C

    WavelengthIndex
    (µm)
    2.63.3239
    2.83.3204
    33.3169
    3.23.3149
    3.43.3129
    3.63.3109
    3.83.3089
    43.3069
    4.23.3057
    4.43.3045
    4.63.3034
    4.83.3022
    53.301
    5.23.3001
    5.43.2991
    5.63.2982
    5.83.2972
    63.2963
    6.23.2955
    6.43.2947
    6.63.2939
    6.83.2931
    73.2923
    7.23.2914
    7.43.2905
    7.63.2896
    7.83.2887
    83.2878
    8.23.2868
    8.43.2859
    8.63.2849
    8.83.284
    93.283
    9.23.2818
    9.43.2806
    9.63.2794
    9.83.2782
    103.277
    10.23.2761
    10.43.2752
    10.63.2743
    10.83.2734
    113.2725
    11.23.2713
    11.43.2701
    11.63.269
    11.83.2678
    123.2666
    12.23.2651
    12.43.2635
    12.63.262
    12.83.2604
    133.2589
    13.23.2573
    13.43.2557
    13.63.2541

    What is the GaAs Process?

    GaAs wafers must be prepared prior to device fabrication. To start, they must be completely cleaned to remove any damage that might have occurred during the slicing process. The wafers are then Chemically Mechanically Polished/Plaranrized (CMP) for the final material removal stage. This allows for the attainment of super-flat mirror-like surfaces with a remaining roughness on an atomic scale. After that is completed, the wafer is ready for fabrication.


    What is the Optical properties of GaAs Wafer?

    Infrared refractive index3.3
    Radiative recombination coefficient7·10-10 cm3/s

    Infrared refractive index

    n = k1/2 = 3.255·(1 + 4.5·10-5T)
    for 300 K n= 3.299

    Long-wave TO phonon energy

    hνTO = 33.81·(1 - 5.5·10-5 T) (meV)
    for 300 K hνTO = 33.2 meV

    Long-wave LO phonon energy

    hνLO= 36.57·(1 - 4·10-5 T) (meV)
    for 300 K hνLO = 36.1 meV

    Refractive index n versus photon energy for a high-purity GaAs.(no~5·1013 cm-3).
    Solid curve is deduced from two-beam reflectance measurements at 279 K. Dark circles are obtained from refraction measurements. Light circles are calculated from Kramers-Kronig analysis
    Normal incidence reflectivity versus photon energy.
    .
    Intrinsic absorption coefficient near the intrinsic absorption edge for different temperatures.

    A ground state Rydberg energy RX1= 4.2 meV

    Intrinsic absorption edge at 297 K at different doping levels. n-type doping
    Intrinsic absorption edge at 297 K at different doping levels. p-type doping
    The absorption coefficient versus photon energy from intrinsic edge to 25 eV.
    Free carrier absorption versus wavelength at different doping levels, 296 K
    Conduction electron concentrations are:
    1. 1.3·1017cm-3; 2. 4.9·1017cm-3; 3. 1018cm-3; 4. 5.4·1018cm-3
    Free carrier absorption versus wavelength at different temperatures.
    no = 4.9·1017cm-3
    Temperatures are: 1. 100 K; 2. 297 K; 3. 443 K.

    At 300 K

    For λ~2 µm α=6·10-18 no (cm-1) (no - in cm-1)
    For λ > 4µm and 1017<no<1018cm-3α ≈ 7.5·10-20no·λ3 (cm-1) (no - in cm-3, λ - µm)


    Are You Looking for GaAs Wafer?

    PAM-XIAMEN is your go-to place for everything wafers, including GaAs wafers, as we have been doing it for almost 30 years! Enquire us today to learn more about the wafers that we offer and how we can help you with your next project. Our group team is looking forward to providing both quality products and excellent service for you!

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