CL05B102KB5NNNC Multilayer Ceramic Capacitors MLCC SMD/SMT 1nF+/-10% 50V X7R 1005

CL05B102KB5NNNC Multilayer Ceramic Capacitors MLCC SMD/SMT 1nF+/-10% 50V X7R 1005

Effect of EOS (Electrical Overstress) ‌

Electrical Overstress such as a surge voltage or EOS can cause damages to MLCC, resulting in the electrical short failure caused by the dielectric breakdown in MLCC. ‌

Down time of MLCC is varied with the applied voltage and the room temperature and a dielectric shock caused by EOS can accelerate heating on the dielectric. Therefore, it can bring about a failure of MLCC in a market at the early stage. ‌

Please use caution not to apply excessive electrical overstress including spike voltage MLCC when preparing MLCC for testing or evaluating.

(1) Surge When the overcurrent caused by surge is applied to MLCC, the influx of current into MLCC can induce the overshooting phenomenon of voltage as shown in the graph below and result in the electrical short failure in MLCC. Therefore, it is necessary to be careful to prevent the influx of surge current into MLCC.

(2) ESD (Electrostatic Discharge) Since the voltage of the static electricity is very high but the quantity of electric charge is small compared to the surge, ESD can cause damage to MLCC with low capacitance as shown in the following graph, whereas surge with lots of electric charge quantity can cause damages to even high capacitance MLCC.

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