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Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um

    Buy cheap Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um from wholesalers
     
    Buy cheap Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um from wholesalers
    • Buy cheap Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um from wholesalers

    Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um

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    Brand Name : OPTO-EDU
    Model Number : A62.4501
    Certification : CE, Rohs
    Price : FOB $1~1000, Depend on Order Quantity
    Payment Terms : L/C,T/T,Western Union
    Supply Ability : 5000 pcs/ Month
    Delivery Time : 5~20 Days
    • Product Details
    • Company Profile

    Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um

    • Basic Level, Separate Controller & Main Body Design, With Contact Mode, Tapping Mode,
    • Scan Range XY 20x20um, Z 2.5um, Scan Resolution XY 0.2nm, Z 0.05nm
    • Sample Size Dia.<90mm, H<20mm, Stage Moving 15x15mm, Optical Objective APO 4x Resolution 2.5um
    • Scan Speed 0.6~30Hz, Scan Angle 0-360°, Output USB3.0 For Win7/8/10/11
    • Optional Work Mode: Friction Mode, Phase Mode, Magnetic Mode, Electrostatic Mode
    ◆ The laser detection head and the sample scanning stage are integrated, the structure is very stable, and the anti-interference is strong
    ◆ Precision probe positioning device, laser spot alignment adjustment is very easy
    ◆ The single-axis drive sample automatically approaches the probe vertically, so that the needle tip is perpendicular to the sample scan
    ◆ The intelligent needle feeding method of motor-controlled pressurized piezoelectric ceramic automatic detection protects the probe and the sample
    ◆ High-precision and wide-ranging piezoelectric ceramic scanners can be freely selected
    ◆ High-magnification objective lens automatic optical positioning, no need to focus, real-time observation and positioning of the probe sample scanning area
    ◆ Spring suspension shockproof method, simple and practical, good shockproof effect
    ◆ Metal shielded soundproof box, built-in high-precision temperature and humidity sensor, real-time monitoring of the working environment
    ◆ Integrated scanner nonlinear correction user editor, nanometer characterization and measurement accuracy better than 98%


    SpecificationA62.4500A62.4501A62.4503A62.4505
    Work ModeTapping Mode
    【Optional】
    Contact Mode
    Friction Mode
    Phase Mode
    Magnetic Mode
    Electrostatic Mode
    Contact Mode
    Tapping Mode
    【Optional】
    Friction Mode
    Phase Mode
    Magnetic Mode
    Electrostatic Mode
    Contact Mode
    Tapping Mode
    【Optional】
    Friction Mode
    Phase Mode
    Magnetic Mode
    Electrostatic Mode
    Contact Mode
    Tapping Mode
    【Optional】
    Friction Mode
    Phase Mode
    Magnetic Mode
    Electrostatic Mode
    Current Spectrum CurveRMS-Z Curve
    【Optional】
    F-Z Force Curve
    RMS-Z Curve
    F-Z Force Curve
    RMS-Z Curve
    F-Z Force Curve
    RMS-Z Curve
    F-Z Force Curve
    XY Scan Range20×20um20×20um50×50um50×50um
    XY Scan Resolution0.2nm0.2nm0.2nm0.2nm
    Z Scan Range2.5um2.5um5um5um
    Y Scan Resolution0.05nm0.05nm0.05nm0.05nm
    Scan Speed0.6Hz~30Hz0.6Hz~30Hz0.6Hz~30Hz0.6Hz~30Hz
    Scan Angle0~360°0~360°0~360°0~360°
    Sample SizeΦ≤90mm
    H≤20mm
    Φ≤90mm
    H≤20mm
    Φ≤90mm
    H≤20mm
    Φ≤90mm
    H≤20mm
    XY Stage Moving15×15mm15×15mm25×25um25×25um
    Shock-Absorbing DesignSpring SuspensionSpring Suspension
    Metal Shielding Box
    Spring Suspension
    Metal Shielding Box
    -
    Optical Syestem4x Objective
    Resolution 2.5um
    4x Objective
    Resolution 2.5um
    4x Objective
    Resolution 2.5um
    Eyepiece 10x
    Infinity Plan LWD APO 5x10x20x50x
    5.0M Digital Camera
    10" LCD Monitor, With Measuring
    LED Kohler Illumination
    Coaxial Coarse & Fine Focusing
    OutputUSB2.0/3.0USB2.0/3.0USB2.0/3.0USB2.0/3.0
    SoftwareWin XP/7/8/10Win XP/7/8/10Win XP/7/8/10Win XP/7/8/10

     ResolutionWorking ConditionWorking TemperationDamge to SampleInspection Depth
    SPMAtom Level 0.1nmNormal, Liquid, VacuumRoom or Low TemperationNone1~2 Atom Level
    TEMPoint 0.3~0.5nm
    Lattice 0.1~0.2nm
    High VaccumRoom TemperationSmallUsually <100nm
    SEM6-10nmHigh VaccumRoom TemperationSmall10mm @10x
    1um @10000x
    FIMAtom Level 0.1nmSuper High Vaccum30~80KDamgeAtom Thickness
    MicroscopeOptical MicroscopeElectron MicroscopeScanning Probe Microscope
    Max Resolution (um)0.180.000110.00008
    RemarkOil immersion 1500xImaging diamond carbon atomsImaging high-order graphitic carbon atoms
    Probe-Sample InteractionMeasure SignalInformation
    ForceElectrostatic ForceShape
    Tunnel CurrentCurrentShape, Conductivity
    Magnetic ForcePhaseMagnetic Structure
    Electrostatic ForcePhasecharge distribution
    Quality Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um for sale
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