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HD-E900 Potential Induced Degradation(PID) Test Machine

    Buy cheap HD-E900 Potential Induced Degradation(PID) Test Machine from wholesalers
     
    Buy cheap HD-E900 Potential Induced Degradation(PID) Test Machine from wholesalers
    • Buy cheap HD-E900 Potential Induced Degradation(PID) Test Machine from wholesalers
    • Buy cheap HD-E900 Potential Induced Degradation(PID) Test Machine from wholesalers
    • Buy cheap HD-E900 Potential Induced Degradation(PID) Test Machine from wholesalers

    HD-E900 Potential Induced Degradation(PID) Test Machine

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    Brand Name : Haida
    Model Number : HD-E900
    Certification : ISO,CE
    Price : Negotiable
    Payment Terms : L/C,D/A,D/P,T/T,Western Union,MoneyGram
    Supply Ability : 30 Sets per Month Haida
    Delivery Time : 15 days after order confirmed
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    HD-E900 Potential Induced Degradation(PID) Test Machine

    HD-E900 Potential Induced Degradation(PID) Test Machine
    APPLICATION

    Potential Induced Degradation (PID) testing evaluates the ability of photovoltaic modules to resist potential-induced deterioration by simulating harsh electric field and humid heat conditions.

    TECHNICAL PARAMETERS
    ItemSpecification
    DC Regulated Power Supply12 channels(Independently monitoring and control)
    Each channel can independently control the voltage polarity
    Voltage range-2000V ~ 2000V
    Voltage resolution1V
    Voltage stabilityFor continuous output of 1000V, 1500V, and 2000V, voltage fluctuation is ≤2% within 500 hours
    Connection methodModule frame grounded, connector shorted and then connected to the high-voltage terminal; for negative voltage testing and positive voltage recovery, only switch toggling is needed, no change in connection method required
    Voltage application method20 power channels operate independently, capable of outputting different polarities and voltages
    Voltage accuracy±3% (referencing CNAS-CL01-A021:2018)
    Voltage tolerance0.5% (referencing IEC 62804-1-1:2020)
    Current measurement range0~1mA
    Resolution: 0.01μA (as specified in IEC 62804-1-1:2020)
    Acquisition interval≤5min(adjustable at software)
    Safety protection featuresOvercurrent alarm, overvoltage alarm, overtemperature alarm, communication interface with environmental test chamber
    PowerSingle phase, 220V, 50Hz
    TEST STANDARD
    ItemsDescription
    Test StandardIEC61215-2: 2021 MQT 21 Potential Induced Degradation Test
    IEC 62804-1-1:2020“Photovoltaic (PV) modules - Test methods for the detection of potential-induced degradation Part 1-1 Crystalline silicon – Delamination"
    IEC 63209:2019 Extended-stress testing of photovoltaic modules
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