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E4727B Keysight Noise Analyzer Low Frequency With 1A Current Capability

    Buy cheap E4727B Keysight Noise Analyzer Low Frequency With 1A Current Capability from wholesalers
     
    Buy cheap E4727B Keysight Noise Analyzer Low Frequency With 1A Current Capability from wholesalers
    • Buy cheap E4727B Keysight Noise Analyzer Low Frequency With 1A Current Capability from wholesalers
    • Buy cheap E4727B Keysight Noise Analyzer Low Frequency With 1A Current Capability from wholesalers
    • Buy cheap E4727B Keysight Noise Analyzer Low Frequency With 1A Current Capability from wholesalers
    • Buy cheap E4727B Keysight Noise Analyzer Low Frequency With 1A Current Capability from wholesalers
    • Buy cheap E4727B Keysight Noise Analyzer Low Frequency With 1A Current Capability from wholesalers

    E4727B Keysight Noise Analyzer Low Frequency With 1A Current Capability

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    Brand Name : Keysight
    Model Number : E4727B
    Price : $10,000
    Delivery Time : Delivery time for minimum order quantity ≤ 30 days
    Payment Terms : T/T ‌L/C
    Supply Ability : 100 units/day
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    E4727B Keysight Noise Analyzer Low Frequency With 1A Current Capability

    E4727B Advanced Low Frequency Noise Analyzer
    Get a deeper and closer look at low frequency noise using A-LFNA integrated with WaferPro Express, featuring data analysis, wafer prober control, and test suite automation.
    Highlights
    The Advanced Low Frequency Noise Analyzer integrates with PathWave WaferPro (WaferPro Express) to enable turnkey noise measurements as well as measurements of DC characteristics, capacitance, and RF S-parameters
    Measure extremely low device noise, such as transistor linear region noise, with the newly designed LNA
    The state-of-the-art new LNA also allows noise measurements at very low bias currents
    High power device noise measurements even at high currents like 1A
    Fast measurements with multiple averaging for increased measurement efficiency even at high accuracy
    This software module measures DC characteristics, 1/f noise, and random telegraph noise and performs data analysis

    FeatureDescription / Capability
    Software IntegrationSeamless integration with PathWave WaferPro (WaferPro Express) software enables turnkey solutions for noise, DC characteristics, capacitance, and RF S-parameter measurements.
    Measurement SensitivityNewly designed LNA enables extremely low device noise measurement, such as transistor linear region noise and measurements at very low bias currents.
    High-Power CapabilityCapable of high-power device noise measurement under high current conditions (e.g., up to 1A).
    Measurement SpeedFast measurement speed improves productivity, even under high-accuracy conditions requiring extensive averaging.
    Software Analysis ModuleDedicated software module measures DC characteristics, 1/f noise, and random telegraph noise (RTN), and performs data analysis.
    Probing IntegrationKeysight's collaboration with FormFactor enables a complete, integrated on-wafer solution with autom

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