HXRF-450S XRF X-ray Fluorescence Coating Painting Thickness Tester
1. Introduction of model indicators:
1.1. Working Conditions:
● operating temperature: 15-30℃
● Relative humidity: 40%~50%
● power supply: AC: 220V ± 5V
1.2. Technical performance and indicators:
First, stability: HXRF-450S has good long-term stability, there is
no need to calibrate the instrument frequently
Second, no need to prepare samples: whether for the coating system
or for solid and liquid samples, the instrument can be measured and
analyzed without a standard plate
Third, comprehensive performance: coating analysis qualitative
analysis quantitative analysis bath analysis statistical function
1.3. Main application
Can be used for electronic components, semiconductors, PCB, FPC,
LED bracket, auto parts, functional plating, decorative parts,
connectors, terminals, sanitary ware, jewelry and other industries
surface coating thickness measurement and material analysis, low
cost, high efficiency
1.4 System safe
1 Simple user interface sets limited authorization to daily
operators
2 Supervisors can maintain the system
3 The system automatically generates the operator's usage record
4 Automatic locking prevents unauthorized operations
5 Sample chamber door opening and closing sensor
6 X-ray warning light
7 Front panel security buttons
1.5 Working features
1. Measure 5 layers (4 layers of coating + substrate layer) of
coating, analyze 15 elements at the same time, and automatically
correct X-ray overlapping spectral lines
2. High measurement accuracy and good stability, the measurement
result is accurate to uin
3. Rapid non-destructive measurement, short measurement time, the
fastest measurement results within 10s
4. Can analyze solid and solution; Qualitative, semi-quantitative
and quantitative analysis
5. Material identification and classification detection, material
and alloy element analysis, element spectrum qualitative analysis
6. Powerful data statistics and processing functions: average
value, standard deviation, relative standard deviation, maximum
value, minimum value, etc
7. Result output: directly print or one-click export to PDF, Excel
file; Reports contain data, images, statistical charts, customer
information and more
8. Measurement position preview function; High resolution color CCD
sample observation system with standard optical magnification of 30
times
9. Provide global service and technical support
1.6 Technical parameters
| Measurement element range: | Aluminum (Al) - uranium (U) |
| Detector | SDD |
| Collimator | Types | Fixed single hole |
| Fixed type size | □ 0.15mm □ 0.2mm □ 0.5mm |
| Application Analysis | Optical path system | Vertical irradiation |
| Magnification | Optics: 40-60× |
| Display mode | Elemental spectrum display |
| Element display: | Label pattern display |
| indicators show: | Display elements and measurement values |
| Camera | High-definition industrial camera |
| Magnification function | Local magnification |
| Window size | Ungraded window size |
| Application | Single coating, double coating, alloy coating, electroplating
solution |
| Mainframe case | Input voltage: | AC220V±10% 50/60HZ |
| Communication method: | High-speed USB transmission |
| Temperature control | Preamplifier and chassis temperature control |
| Appearance dimensions | 555*573*573mm |
| Cavity size | 410*478*245mm |
| Multi-channel analysis | Detector address: | Address 4096 |
| Temperature control | Automatic preamplification temperature control |
| X-ray source | X-ray tube | High-precision micro-focusing light tube |
| High pressure | 0-50kV(Program-controlled) |
| Tube current | 0-1mA(Program-controlled) |
| Target: | W Target |
| Detection configuration | Operation mode | High-precision manual adjustment |
| Position control | Manual adjustment at the XY micrometer level |
| Observation window | High-transparency lead glass |
| Test time | 10-40s |
| Software features | FP algorithm, automatic fault diagnosis and correction, automatic
compensation algorithm |
2. Product configuration list
2.1 SDD Semiconductor detector cooled by electricity: (latest
detector)
2.1.1. SDD semiconductor detector cooled by electricity;
resolution: 129 ± 5 EV
2.1.2. Amplification circuit module: detect the sample
characteristic X-rays; further enlarge the collected information.
2.2 X-ray excitation device:
2.2.1. Max. filament current output: 1mA;
2.2.2. Semi-loss component, 50W, air cooling.
2.3 High-pressure Transmitter:
2.3.1. Maximum voltage output: 50kV;
2.3.2. Minimum 5kv controllable adjustment
2.3.3. Self-contained voltage overload protection
