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Power Ate Test System PC Power Test OCP / OVP / SHORT Functional Test Module Test System

    Buy cheap Power Ate Test System PC Power Test OCP / OVP / SHORT Functional Test Module Test System from wholesalers
     
    Buy cheap Power Ate Test System PC Power Test OCP / OVP / SHORT Functional Test Module Test System from wholesalers
    • Buy cheap Power Ate Test System PC Power Test OCP / OVP / SHORT Functional Test Module Test System from wholesalers

    Power Ate Test System PC Power Test OCP / OVP / SHORT Functional Test Module Test System

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    Brand Name : Topfer
    Model Number : Top-Smart 1100
    Price : to be discussed
    Payment Terms : T/T
    Supply Ability : 10 sets /30 days
    Delivery Time : 2 to 3 weeks
    • Product Details
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    Power Ate Test System PC Power Test OCP / OVP / SHORT Functional Test Module Test System

    Power ate test system, PC power test, OCP/OVP/SHORT functional test module test system


    1. High degree of automation enhances testing efficiency

    Automatically execute the test process: Through preset programs, automatically complete tests on input/output characteristics, protection functions, energy efficiency, etc., reducing manual operation time.

    Multi-channel parallel testing: Supports simultaneous testing of multiple power supply samples, significantly shortening the batch testing cycle (such as full inspection of fast charging power sources on the production line).

    7× 24-hour continuous operation: Suitable for scenarios such as aging tests and life tests, no manual intervention is required.


    2. High testing accuracy and traceable data

    Accurately measure key parameters:

    Voltage/current accuracy: Up to 0.1% range accuracy (such as output from a 5V/1A adapter).

    Ripple noise: Resolution up to 1mVpp (oscilloscope-level measurement).

    Energy efficiency test: The error of the power analyzer is <0.5% (meeting the DoE/ Energy Star standard).

    Eliminate human errors: Automate data collection to avoid deviations from manual reading or recording.

    Data storage and traceability: Test results are automatically generated into Excel/PDF reports, supporting barcode scanning to associate sample information.


    Open

    • The open software architecture provides users with a flexible, powerful and cost-effective automatic testing system.
    • Scalable hardware and the addition of new test items;
    • It supports barcode pre-scanning function and the function of scanning barcodes while testing, which improves the overall testing speed.
    • Supports modular electronic loads (such as TDL-6030GD, etc.) and single-channel electronic loads (such as TDL-6030C, etc.);

    General

    • Supports all-round testing of various power supplies (such as industrial power supplies, PC power supplies, chargers, adapters, etc.);
    • Complies with the measurement requirements of ENERGY STAR and IEC 62301;
    • Support the manufacturing Information system (ShopFloor) interface;
    • Supports various power parameter tests in CV.CC, CR.CW modes;
    • Optimize the display mode, and the hardware configuration can be combined freely;

    Professional

    • Support complete testing of industrial power supplies;
    • High-precision timing testing;
    • High testing efficiency, meeting the requirements of mass production;
    • Standard test items can be optimized for power supply characteristics, which are simple and easy to learn.

    High-speed

    • The speed of various power supply tests is more than twice that of conventional test systems.
    • The test commands are editable to help improve the test speed.
    • Parallel Bar Code Reader is carried out during the test, which greatly improves the test speed;

    Test Items of the Charger Automatic Testing System Top-Smart 1100:

    Test itemsTest items
    DC output voltageInput voltage ramp
    DC output currentInput freq. ramp
    Peak-Peak noiseTracking
    Transient response timeShort circuit test
    Transient spikeShort circuit current
    Voltage regulationOV protection
    Current regulationUV protection
    Turn ON timeOL protection
    Rise timeOP protection
    Fall timeIn-test adjustment
    Hold-up timeAC cycle drop out
    Inrush current testPLD simulation
    Power good signalGPIB read/write
    Power fail signal232 read/write
    P/S ON signalUSB read/write
    Power up sequenceTTL signal control
    Power off sequenceRelay control
    EffciencyBar code scan
    Input RMS currentDynamic test
    Input powerDC Current under C.V.Mode
    Input power factor

    DC : specification under C.P.Mode


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