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Power Supply ATE With High Voltage Test Power Supply Automatic Battery Comprehensive Tester

    Buy cheap Power Supply ATE With High Voltage Test Power Supply Automatic Battery Comprehensive Tester from wholesalers
     
    Buy cheap Power Supply ATE With High Voltage Test Power Supply Automatic Battery Comprehensive Tester from wholesalers
    • Buy cheap Power Supply ATE With High Voltage Test Power Supply Automatic Battery Comprehensive Tester from wholesalers

    Power Supply ATE With High Voltage Test Power Supply Automatic Battery Comprehensive Tester

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    Brand Name : Topfer
    Model Number : Top-Smart 2000
    Price : to be discussed
    Payment Terms : T/T
    Supply Ability : 10 sets /30 days
    Delivery Time : 2 to 3 weeks
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    • Company Profile

    Power Supply ATE With High Voltage Test Power Supply Automatic Battery Comprehensive Tester

    Factory direct sales power supply ATE with high-voltage test power supply, automatic tester, battery comprehensive tester


    The eight benefits of the automatic power supply testing system are:

    1. Fast speed, high efficiency and strong reliability;

    2. Large-scale production can significantly reduce the usage cost (compared with manual testing).

    3. It can automatically generate test reports for convenient reference at any time.

    4. Possess statistical analysis capabilities for defective products and can assist engineers in analyzing the causes of defective products

    5. The system design is flexible and can be customized according to the customer's own needs.

    6. Stable and reliable, select the best equipment combination to complete various tests;

    7. The price of the power supply testing system is controllable. According to the customer's own needs, they can choose some testing equipment with the best cost performance during use to reduce the price of the entire system.

    8. Economical and cost-effective, the customer's existing suitable equipment can be applied to the power supply testing system, avoiding the waste of the original equipment caused by the customer's equipment update.


    Open

    • An open hardware platform that allows for the addition or removal of various testing devices according to customer needs (including devices with GPIB, RS-232, USB interfaces, etc.)

    • The ATE power supply testing system supports simultaneous testing of multiple single-group/multiple-group output power supplies, significantly increasing production line capacity.

    • An open software platform, the ATE power supply testing system can be expanded with new test items and functions based on customer testing requirements.

    • The ATE power supply testing system supports simultaneous multi-lane barcode pre-scanning and scanning during testing, enhancing overall testing speed.


    Universal

    • The ATE power supply testing system supports testing of various power supplies (LED power supplies, adapters/chargers, PC power supplies, inverters, communication power supplies, etc.)

    • Complies with ENERGY STAR and IEC 62301 measurement requirements.

    • Supports Manufacturing Information System (ShopFloor) interface.

    • The ATE power supply testing system supports testing of various power parameters under CV, CC, CR, LED modes.

    • Optimizes display mode, allowing for any combination of hardware configurations.


    High-Speed

    • The ATE power supply testing system supports simultaneous testing of multiple single-group/multiple-group output power supplies, significantly increasing production line capacity. (The testing speed for LED power supplies/adapters/chargers is more than double that of the widely used 6000 series power automatic systems.)

    • Conducts parallel barcode scanning during testing, greatly improving testing speed.


    Top-Smart 2000 ATE Power Supply Testing System Test Items:

    Test itemsComprehensive Test items
    CEC testShort circuit test
    DC Current under C.V.ModeShort circuit current
    Peak-Peak noiseOV protection
    Serial reaction time testUV protection
    Transient response timeOL protection
    Transient spikeOP protection
    TrackingIn-test adjustment test
    Voltage regulationAC cycle drop out
    Current regulationPLD simulation
    Turn ON timeDC output current test
    Rise timeDC output voltage test
    Fall timeWaveform read test
    Hold-up timeInput impulse current test
    Inrush current testInput power
    Power good signalRelay control
    Power fail signalBar code scan
    P/S ON signalDynamic test
    Power up sequenceSpecification under C.P.Mode
    Power off sequenceInput Peak current
    Effciency testAdditional expansion measurement test
    Overall stability testInput RMS current
    Fan Speed testTTL signal control
    Input power factorLAN read/write
    Input voltage rampRS485 read/write
    Input freq. rampUSB read/write
    Extend the measurement test232 read/write
    Automatic testGPIB read/write

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