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all in one detection platform for microscopy

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All-in-One Detection Platform – Custom Modules & Multi-Force Microscopy For Materials Science

Product Description: The Atomic Force Microscope (AFM) is a cutting-edge nanoscale characterization platform designed to provide unparalleled precision and versatility in surface analysis. With a sample size capacity of up to 25 mm, this instrument is ......

Truth Instruments Co., Ltd.

Address: 169 Zhuzhou Road, Laoshan District, Qingdao, Shandong Province, China

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