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IEC 62368-1 Clause 5.3.2, 5.4.10, V.1.4 and Figure V.3 Blunt Probe Product Information: Standard:The test probe is designed and manufactured according to the standard requirements of IEC 62368-1:2018 clause 5.3...
... accessible parts of drum-type dryer, upright electric cooker, cooking bench and oven. Technical parameters: Item Name Surface Temperature Probe Measuring surface Φ5×0...
...Test Groove for Enclosure Mechanical Strength Testing of Audio and Video Equipment Product Introduction Figure 4 shows a test hook specifically developed to verify the mechanical strength of a housing, ensur...
... ingress of solid foreign objects having a diameter of 50mm or greater. It is also regarded as the steel ball for dropping impact test. It can be equipped with a lifting ring, and used for pendulum bob test ...
...5mm or greater. Test sample:Easily accessible enclosure live parts or mechanical parts. Feature:Steel ball, rigid test. Parameters: Model HT-I06 HT-I06T Name Test probe 2 steel ball Test probe 2 steel ball w...
...Probe HT-I24 Standard:IEC60335-2-14 CI.20.102. Application:It is used to test whether the blade of hand-held stirrer is completely concealed from above and flat surface can be touched when the blade is rotat...
...ts through top openings. Test sample:Audio,video and similar electronic apparatus. Feature:It can be used for anti-electric shock test when it is equipped with amphenol connector or used for enclosure protec...
...Test Finger Probe For Lamp Glass Cover IEC60335-2-24 Clause 22.116 Test Finger Probe For Shattering Test Of Lamp Glass Product Details Standard: The center punch is manufacture according to IEC60335-2-24 cla...
... Temperature Test Probe IEC60335 Fig104 Technical parameters: Parameters /Model SC-335F104 Plane of measurement Φ5*0.5mm tin copper plate Drive pipe Inner Φ3,outer Φ5 Thermocouple Φ0.3K type Force 4±0.5 N Pr...
...Probe HT-I12 Standard:IEC61032 figure 12 finger probe 18, IEC335.1,UL1017. Application:It is used to simulate the children who are older than 36 months and younger than 14 years to test whether the hazardous...
...Probe HT-I13 Standard:IEC61032 figure 13 finger probe 19, IEC335.1,UL1017. Application:It is used to simulate the children who are younger than 36 months to test whether the hazardous parts can be touched. T...
...:It is used for interlocking apparatus of the covert door of microwave oven. Test sample:Microwave oven. Feature:Please use according to related standard. Parameters: Model HT-I28 Probe diameter Ф3 0 -0.10 H...
...Test Pin Probe HT-I30 Standard:BS1363.1 clause 12.6.1 figure 1 and IEC 60065. Application:It is used to test for the electronic equipment to see whether the hidden dangerous parts of the terminal device of c...
Test Probe HT-I33 Standard:IEC60335-2-14. Application:The stirrer shall incorporate a biased-off switch that is recessed or guarded to prevent accidental operation. Test sample:Hand held blender. Feature:Applia...
...Probe 5 Pin Connector Adapters are used to make reliable transitions from one connector interface to another. They are typically used for test and measurement, between equipment mounted connectors and device...
... of solid foreign objects having a diameter of 12.5mm or greater. Customizable: used for enclosure protection test when open threaded hole of M6 at the end of the handle (connected with pull and push dynamom...
...), mainly telephone jacks and operator areas. Satisfies basic standard for telecom product safety Hot Tags: telecommunications voltage test probe, China, manufacturers, suppliers, factory, custom, wholesale,...
... is made of nylon and the probe is made of stainless steel. Standard:UL1278 Fig 10.3. Application:The heating element and any part of the element assembly (such as an element support, sheath and similar part...
... Temperature Test Probe IEC60335 Fig104 Technical parameters: Parameters /Model SC-335F104 Plane of measurement Φ5*0.5mm tin copper plate Drive pipe Inner Φ3,outer Φ5 Thermocouple Φ0.3K type Force 4±0.5 N Pr...
...Probe 5 Pin Connector Adapters are used to make reliable transitions from one connector interface to another. They are typically used for test and measurement, between equipment mounted connectors and device...