| Sign In | Join Free | My burrillandco.com |
|
Customized Standard Gold Plating Contact Probe Pins for PCB & ICT Test Product Description Customized ultra-sharp pogo pin ICT test probe pin electronic spring probe designed for precision testing applications....
...Test Probe YF-004 for In-Circuit-Test (ICT) Production Specifications Product Images Detailed Component Illustration Comparison of different test probe tip types and configurations Customization Options At S...
...probe C for IP3X testing: Φ2.5 rod-length 100 Test Probe D for IP4X testing: Φ1.0 wire-length 100 Test Probe 1: 500g steel sphere Test probe 2: 15g steel sphere Test Probe A Introduction: Designed according ...
...Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO58DB885-003 Dual-Head High-Frequency IC Test Probe Precision spring-loaded semiconductor test pins designed for reliable performance in demanding test...
...appliance for domestic and similar electrical appliance of against electric shock protection test. Technical Parameters: 1, Ball Diameter: 50mm 2, Baffle Plate Diameter: 45mm 3, Baffle Plate Thickness:4mm 4,...
...Test Probe A with 50N thrust Article NO.: BND-A Specification: IP1X Probe A /Test Probe A 1, According to : IEC61032:1997 /IEC60529:2001 and UL 2, IP1X Probe A (Test Probe A) is necessary appliance for domes...
...Test Probe Product overview: The Joint Test Probe of Figure meets the standard requirements of UL507 Fig 9.2 (PA100A), IEC 62368-1:2018 clause 4.8, 5.3.2, 8.5.4.3, V.1.2 and figure V.1, etc., UL474 Fig 5.1, ...
... V.1.6,. This rod probe is intended to verify the protection of persons against access to hazardous parts. It is also used to verify the protection against access with a wire. can be used for anti-electric s...
... Test Probe YOUFU UF-FTO55FD030-002 High Quality Switch Contact Pin Test Probe YF DE2-055BB30-01C0. Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing appl...
... Test Probe YOUFU UF-FTO58BD058-001 High Quality Switch Contact Pin Test Probe YF DE2-055BB30-01C0. Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing appl...
IEC 61850 Test System Model: RELAYSTAR-6000D The RELAYSTAR-6000D is new generation test set dedicated to IEC 61850-based protection devices and Merging Unit. It can simulate various types of messages which conf...
IEC 61850 Test System Model: RELAYSTAR-6000D The RELAYSTAR-6000D is new generation test set dedicated to IEC 61850-based protection devices and Merging Unit. It can simulate various types of messages which conf...
...Test Probe P156-H is accurately computer machined to ensure dimensional , making it ideal for industrial testing applications where accuracy is crucial. DURABLE MATERIAL: Made from high-quality brass, these ...
High Quality Switch Contact Pin Test Probe YF DE1-051BB33-01C0 High Efficiency BGA Testing Probes Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing applicati...
High Quality Switch Contact Pin Test Probe YF DE2-055BB30-01C0 High Efficiency BGA Testing Probes Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing applicati...
...Test Probes Well-established test probes for contacting PCBs For optimal contact to the test points (e.g. pads, vias, and pins), various tip styles with various diameters and finishes are available. Various ...
...-E2 Spring Test Probe, E type conical head. Great replacement probes to extend the life of your test station. Specification: Head Diameter 1.3mm, Tube Diameter 1.02mm, Shank Diameter 0.74mm, Length 16.5mm, D...
....35mm, Drill Size: 2.4mm, Minimum Test Distance: 3.18mm, Full Stroke 6.35mm, Spring Pressure 180g, Current 5A, Resistance 50m Ohm Made of high quality ......
Electric Cable Switching Probe YF DE2-038FD31-02C0 High Efficiency BGA Testing Probes - Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing applications. Key P...
High Quality Switch Contact Pin Test Probe YF DE1-048DD130-01C0 High Efficiency BGA Testing Probes Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing applicat...