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                    8x~800000x With Detector SED+CCD, Five Axes Manual Stage or Motorized Stage E-Beam Acceleration With Stable Beam Current Supply Excellent Image Under Low Voltage Non Conduction Sample Can Be Observed Directly N...
 
                    6x~1000000x With Detector SED+CCD, Five Axes Motorized Stage E-Beam Acceleration With Stable Beam Current Supply Excellent Image Under Low Voltage Non Conduction Sample Can Be Observed Directly No Need To Be Sp...
 
                    --Glass processing chamber: 100mm; 130mm High. --Specimen stage size: 40mm( Hold 6 specimen cups) --Golden target size: 58mm*0.12mm(thickness) --Vacuum detection: Pirani gage --Vacuum protection:20 pa with m...
 
                    8x~800000x With Detector SED+CCD, Five Axes Manual Stage or Motorized Stage E-Beam Acceleration With Stable Beam Current Supply Excellent Image Under Low Voltage Non Conduction Sample Can Be Observed Directly N...
 
                    Specification A63.7140 A63.7160 Key Parameters Resolution 1.4nm@15kV(SE) 2.5nm@30.0kV(BSE) 0.9nm@30kV(SE) 1.2nm@15kV(SE) 1.5nm@1kV(SE, BD mode) Accelerating Voltage 0.02kV30kV 0.02kV30kV Magnification 120000...
 
                    Magnification 200000x Resolution 6nm@18KV(SE) With Detector SE+BSE+CCD, Optional EDS, Standard 2 Axis Motorized Stage, Moving X 40mm, Y30mm, Max Specimen 50xH35mm Built-in Condenser No Need Manual Adjust Apert...
 
                    Magnification 1000000x Resolution 2.5nm@15KV With SE+BSE+CCD, Optional EDS Shotty FEG Catridge Voltage 1-15kV, Standard Detector SE, BSE, CCD, Optional EDS, Standard X/Y Motorized Stage, Optional 3 Axes X/Y/Z o...
 
                    Teaching Polarized Light Microscopy Gyps1 (18mm) Compensator NCP-P200 Description This series microscope is a universal-type polarizing microscope, designed for teaching and conventional using. Plan destressi...
 
                    Optical + Atomic Force Microscope, All-in-One Integrated design of optical metallographic microscope and atomic force microscope, powerful functions It has both optical microscope and atomic force microscop...
 
                    4.5 - 6nm High Magnification Scanning Electron Microscope Surface Topography Eco SEM Scanning electron microscopy (sem) is suitable for the observation of the surface topography of metals, ceramics, semiconduct...
 
                    ...Scanning Electron Microscope, SE, 20x~150000x 20x~150000x Resolution 5nm With Detector SE, Optional BSE, EDS, CCD Standard X/Y/R 3 Axes Working Stage, Optional Five Axes Working Stage X/Y/Z/R/T 2-Stage Elect...
 
                    Tungsten Filament Scanning Electron Microscope, SE+BSE, 150000x 150000x Magnification With Detector SE+BSE+CCD, Optional EDS Standard X/Y Motorized Working Stage, ......
 
                    ... Standard 3 MA PMTs, GaAsP PMT Optional ▶ Microscope Inverted Fluorescent Microscope, full motorized, infinity plan SUPER APO objective 10x20x40x60x100x ▶ Camera 5 million pixels, color camera, SONY IMX264, ...
 
                    ...Scanning Atomic Force Microscope Gantry scanning head design, marble base, vacuum adsorption stage, sample size and weight are basically unlimited Intelligent needle feeding method with automatic detection o...
 
                    ... Camera Scanning Resolution 20x Scan ≤0.24um/pixel, 40x Scan ≤0.12um/pixel Scanning Speed 15x15mm Area 20x Scan <35s, 40x Scan <50s M30.5815 Full Auto Microscope Slide Scanner Specification Slide Capacity 5 Standard pathology slides (75*25mm), or 2...
 
                    ...Scanning Electron Atomic Force Microscope OPTO-EDU A62.4501 Product Description 1. Scan head and sample stage are designed together, strong anti-vibration performance 2. Precision laser detection and probe a...
 
                    ... pressure shift scanner, which can scan with high precision in a wide range Intelligent needle feeding method with automatic detection of motor-controlled piezoelectric ceramics to protect ......
 
                    Basic Level, Separate Controller & Main Body Design, With Contact Mode, Tapping Mode, Scan Range XY 20x20um, Z 2.5um, Scan Resolution XY 0.2nm, Z 0.05nm Sample Size Dia.<90mm, H<20mm, Stage Moving 15x15mm, Optical Objective APO 4x Resolution 2.5um Scan ......
 
                    Teaching Level Atomic Force Microscope Teaching Level Separate controller & main body design, with Tapping Mode, 4x Objective, Miniaturized Detachable Design The laser detection head and the sample scanning sta...