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...Test Probe D with 1N force Article NO.:BND-D Basic Introduction: 1,According to: IEC61032:1997/IEC60529:2001 AND UL 2,P4X Test Probe D ( Test Probe D)is a necessary appliance for domestic and similar electri...
...Test Probe D Article NO.:BND-D Basic Introduction: 1,According to: IEC61032:1997/IEC60529:2001 AND UL 2,P4X Test Probe D ( Test Probe D)is a necessary appliance for domestic and similar electrical appliance ...
Customized Standard Gold Plating Contact Probe Pins for PCB & ICT Test Product Description Customized ultra-sharp pogo pin ICT test probe pin electronic spring probe designed for precision testing applications....
...Test Probe YF-004 for In-Circuit-Test (ICT) Production Specifications Product Images Detailed Component Illustration Comparison of different test probe tip types and configurations Customization Options At S...
...probe C for IP3X testing: Φ2.5 rod-length 100 Test Probe D for IP4X testing: Φ1.0 wire-length 100 Test Probe 1: 500g steel sphere Test probe 2: 15g steel sphere Test Probe A Introduction: Designed according ...
... probe 41 Model TP41: IEC 61032 test probe 41 For testing accessibility in appliances with visibly glowing heating elements. Also for testing parts supporting such elements. Complies with IEC, EN, UL & CSA r...
...Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO58DB885-003 Dual-Head High-Frequency IC Test Probe Precision spring-loaded semiconductor test pins designed for reliable performance in demanding test...
... 2.Knurled Finger Length:80mm 3.Baffle Plate Diameter:50mm 4.Baffle Plate Length:100mm 5.M6 thread at the end of the probe(can be connected to the push-pull gauge) Packaging and Shipping 1....
...appliance for domestic and similar electrical appliance of against electric shock protection test. Technical Parameters: 1, Ball Diameter: 50mm 2, Baffle Plate Diameter: 45mm 3, Baffle Plate Thickness:4mm 4,...
...Test Probe A with 50N thrust Article NO.: BND-A Specification: IP1X Probe A /Test Probe A 1, According to : IEC61032:1997 /IEC60529:2001 and UL 2, IP1X Probe A (Test Probe A) is necessary appliance for domes...
...test probe 14AB BND-14AB Technical Parameters: 1, Test Probe Length:80mm 2,Probe Diameter:1.0mm 3,Material:The handle is made of nylon, tip is made of hardened steel 4,Standard: IEC60884 ,IEC61032 Fig.10 1 P...
...test probe 14A with 1N BND-14A Technical Parameters: 1, Test Probe Length:80mm 2,Probe Diameter:1.0mm 3,Material:The handle is made of nylon, tip is made of hardened steel 4,Standard: IEC60884 ,IEC61032 Fig....
...test probe 14B with 20N BND-14B Technical Parameters: 1, Test Probe Length:80mm 2,Probe Diameter:1.0mm 3,Material:The handle is made of nylon, tip is made of hardened steel 4,Standard: IEC60884 ,IEC61032 Fig...
...test probe with 50mm sphere for checking dangerous part Product Description Rigid test probe with 50mm sphere for checking dangerous part Article NO.: BND-A Made in Shenzhen Test Probe A meets the standard r...
...test probe with 1N and 20N force Product Description IEC60884 Socket protective test probe with 1N and 20N BND-14AB Technical Parameters: 1, Test Probe Length:80mm 2,Probe Diameter:1.0mm 3,Material:The handl...
...Test Probe With 20N Force for socket protection Product Description IEC60884 Test Probe With 20N Force for socket protection BND-14A Technical Parameters: 1, Test Probe Length:80mm 2,Probe Diameter:1.0mm 3,M...
...Test Probe With 1N Force for socket protection Product Description IEC60884 Test Probe With 1N Force for socket protection BND-14B Technical Parameters: 1, Test Probe Length:80mm 2,Probe Diameter:1.0mm 3,Mat...
... of person aganist access to to harzardous parts of an IP2 code.Also used to verify protection from access with the back of the hand for an IP suffix B code. Standard test finger probe is made of plastic and...
... Test Probe YOUFU UF-FTO55FD030-002 High Quality Switch Contact Pin Test Probe YF DE2-055BB30-01C0. Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing appl...
... Test Probe YOUFU UF-FTO58BD058-001 High Quality Switch Contact Pin Test Probe YF DE2-055BB30-01C0. Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing appl...