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..., it can test 6sections in one time. It can be used to test the large diameter piles with more than 4pcs sonic tubes. It can also be used for testing the DWALL defect. With the strong probe signal, the probe...
...enclosure protection test of the electrical equipment. Test sample: Easily accessible enclosure live parts or mechanical parts. Feature: Nylon handle + probe, it is manufactured according to the standard fig...
...Test Finger Probe Test Rod For Waste Food Processor Standard: IEC 60335-2-16 clause 22.102 ‘Household and similar electrical appliances -safety-Part 2-16:particular requirements for food waste disposers’. Ap...
...Test Finger Probe 12mm Diameter & Dual Joint Design Product Description The HT-I19 Test Finger Probe is a precision safety testing tool engineered to simulate human finger contact for evaluating electrical e...
...testing equipment eddy current testing machine Including two probes of diameter 14 mm working frequency of 60 KHz and diameter 8mm working frequency of 500 KHz of a probe; Probe can be Self replacement. Mode...
...Probe Leeb hardness test device Hardness probe Impack device DL hardness probe DL for hardness testing of steel, cast steel with HRC, HRB,HV,HS and HB scales. Its basic principle is that an impingent body wi...
...Test Finger Probe B Of IEC 61032 Figure 2 IEC 61032 Figure 2 IEC60950 Figure 2A Test Finger Probe B Product Details Standard: IEC 61032 figure 2, IEC60950 figure 2A, IEC60884, IEC60335, UL507, and UL1278 fig...
...: 1.0mm Wire length: 100mm Handle length: 100mm Handle diameter: 10mm Sphere dameter: 35mm Description: This wire probe is...
UL Enamel Wire Probe 25 Usage: This probe is use to checking access to enamel coated wire accord to UL standard requirement. stainless steel with stainless stell handle....
Wedge probe IEC62368-1-Figure V.4 Reference Standard: IEC62368-1-Figure V.4 Calibration Certificate:Figure V.4 Wedge probe.pdf Technical Parameters: Test finger length 234mm Knurled length 30/30/40mm Material s...
...Probe For Protection Test On The Lamps This IEC60335-2-24 compliant Φ75mm head probe is specifically designed for protection testing on lamps of household appliances. Product Information: · Standard: IEC6033...
IEC 60335-2-90-Figure101 Test rod for door interlock concealment Parameter: 1,Probe Length:100±0.2mm. 2,Probe Diameter:3 mm. 3,Handle length:20 mm. 4,Handle Diameter:10 mm 5.There is an M6 thread at the tail fo...
...Test Finger Probe With A Center Pin UL 60335-2-24 Figure 101.DVA.2 Articulate Probe With Flat And Cone Shaped Hand 10.5 – 11.5 Year Age Notes: 1 – The probes were designed with a center pin to rotate the han...
...Test Equipment.IEC 62368-1 TESTING AND MEASURING EQUIPMENT No. Items Description 1 Temperature and humidity chamber IEC62368-1-cl.4.1.4 Model:KP-HWS1000L 2 Test Apparatus for device forming mains plug IEC623...
REFT Probes for eddy current Flaw Detection Good probe design and proper probe structure can enhance the defect signal which is difficult to detect and make it easy to be detected. With many years of probe prod...
...Probe Station For In Plane Magnetic Device Transport Testing Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a cutting-edge tool designed for advanced research in electrical trans...
...Testing Product Description: The Cryogenic In-Plane Magnetic Field Probe Station is a versatile and advanced Spintronics Testing Platform designed for precise and accurate spin pumping measurement at low tem...
...Probe Station For Spintronics And Wafer Level Testing Product Description: The Vector Magnetic Probe Station is a cutting-edge tool designed for precise measurements of magnetic fields in Spintronic devices....
... in a variety of research and industrial applications. Equipped with a range of source meters including the SR830, N5173B, Keithley 6221, and Keithley 2182A, this probe station offers unparalleled flexibilit...
...Probe Station For Spintronics And Semiconductor Testing Product Description: The 1D In-Plane Magnetic Field Probe Station is a cutting-edge device designed for precise and efficient characterization of spint...