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GaSb Wafer Used For Infrared Detectors,Infrared LEDs And Lasers And Transistors, And Thermophotovoltaic Systems

    Buy cheap GaSb Wafer Used For Infrared Detectors,Infrared LEDs And Lasers And Transistors, And Thermophotovoltaic Systems from wholesalers
     
    Buy cheap GaSb Wafer Used For Infrared Detectors,Infrared LEDs And Lasers And Transistors, And Thermophotovoltaic Systems from wholesalers
    • Buy cheap GaSb Wafer Used For Infrared Detectors,Infrared LEDs And Lasers And Transistors, And Thermophotovoltaic Systems from wholesalers

    GaSb Wafer Used For Infrared Detectors,Infrared LEDs And Lasers And Transistors, And Thermophotovoltaic Systems

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    Brand Name : PAM-XIAMEN
    Price : By Case
    Payment Terms : T/T
    Supply Ability : 10,000 wafers/month
    Delivery Time : 5-50 working days
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    GaSb Wafer Used For Infrared Detectors,Infrared LEDs And Lasers And Transistors, And Thermophotovoltaic Systems

    GaSb Wafer Used For Infrared Detectors,Infrared LEDs And Lasers And Transistors, And Thermophotovoltaic Systems

    Product Description

    PAM-XIAMEN offers Compound Semiconductor GaSb wafer – gallium antimonide which are grown by LEC(Liquid Encapsulated Czochralski) as epi-ready or mechanical grade with n type, p type or semi-insulating in different orientation(111)or(100).

    Gallium antimonide (GaSb) is a semiconducting compound of gallium and antimony of the III-V family.It has a lattice constant of about 0.61 nm. GaSb can be used for Infrared detectors,infrared LEDs and lasers and transistors, and thermophotovoltaic systems.

    Here is the detail specification:

    2″(50.8mm)GaSb Wafer Specification

    3″(50.8mm)GaSb Wafer Specification

    4″(100mm) GaSb Wafer Specification

    2″ GaSb Wafer Specification

    ItemSpecifications
    DopantUndopedZincTellurium
    Conduction TypeP-typeP-typeN-type
    Wafer Diameter2″
    Wafer Orientation(100)±0.5°
    Wafer Thickness500±25um
    Primary Flat Length16±2mm
    Secondary Flat Length8±1mm
    Carrier Concentration(1-2)x1017cm-3(5-100)x1017cm-3(1-20)x1017cm-3
    Mobility600-700cm2/V.s200-500cm2/V.s2000-3500cm2/V.s
    EPD<2×103cm-2
    TTV<10um
    BOW<10um
    WARP<12um
    Laser Markingupon request
    Suface FinishP/E, P/P
    Epi Readyyes
    PackageSingle wafer container or cassette

    3″ GaSb Wafer Specification

    ItemSpecifications
    Conduction TypeP-typeP-typeN-type
    DopantUndopedZincTellurium
    Wafer Diameter3″
    Wafer Orientation(100)±0.5°
    Wafer Thickness600±25um
    Primary Flat Length22±2mm
    Secondary Flat Length11±1mm
    Carrier Concentration(1-2)x1017cm-3(5-100)x1017cm-3(1-20)x1017cm-3
    Mobility600-700cm2/V.s200-500cm2/V.s2000-3500cm2/V.s
    EPD<2×103cm-2
    TTV<12um
    BOW<12um
    WARP<15um
    Laser markingupon request
    Suface finishP/E, P/P
    Epi readyyes
    PackageSingle wafer container or cassette

    4″ GaSb Wafer Specification

    ItemSpecifications
    DopantUndopedZincTellurium
    Conduction TypeP-typeP-typeN-type
    Wafer Diameter4″
    Wafer Orientation(100)±0.5°
    Wafer Thickness800±25um
    Primary Flat Length32.5±2.5mm
    Secondary Flat Length18±1mm
    Carrier Concentration(1-2)x1017cm-3(5-100)x1017cm-3(1-20)x1017cm-3
    Mobility600-700cm2/V.s200-500cm2/V.s2000-3500cm2/V.s
    EPD<2×103cm-2
    TTV<15um
    BOW<15um
    WARP<20um
    Laser markingupon request
    Suface finishP/E, P/P
    Epi readyyes
    PackageSingle wafer container or cassette

    1)2″(50.8mm),3″(76.2mm)GaSb wafer

    Orientation:(100)±0.5°
    Thickness(μm):500±25;600±25
    Type/Dopant:P/undoped;P/Si;P/Zn
    Nc(cm-3):(1~2)E17
    Mobility(cm2/V ·s):600~700
    Growth Method:CZ
    Polish:SSP

    2)2″(50.8mm)GaSb wafer
    Orientation:(100)±0.5°
    Thickness(μm):500±25;600±25
    Type/Dopant:N/undoped;P/Te
    Nc(cm-3):(1~5)E17
    Mobility(cm2/V ·s):2500~3500
    Growth Method:LEC
    Polish:SSP

    3)2″(50.8mm)GaSb wafer
    Orientation:(111)A±0.5°
    Thickness(μm):500±25
    Type/Dopant:N/Te;P/Zn
    Nc(cm-3):(1~5)E17
    Mobility(cm2/V ·s):2500~3500;200~500
    Growth Method:LEC
    Polish:SSP

    4)2″(50.8mm)GaSb wafer
    Orientation:(111)B±0.5°
    Thickness(μm):500±25;450±25
    Type/Dopant:N/Te;P/Zn
    Nc(cm-3):(1~5)E17
    Mobility(cm2/V ·s):2500~3500;200~500
    Growth Method:LEC
    Polish:SSP

    5)2″(50.8mm)GaSb wafer
    Orientation:(111)B 2deg.off
    Thickness(μm):500±25
    Type/Dopant:N/Te;P/Zn
    Nc(cm-3):(1~5)E17
    Mobility(cm2/V ·s):2500~3500;200~500
    Growth Method:LEC
    Polish:SSP

    Relative products:
    InAs wafer
    InSb wafer
    InP wafer
    GaAs wafer
    GaSb wafer
    GaP wafer

    Gallium Antimonide (GaSb) can be supplied as wafers with as-cut, etched or polished finishes and are available in a wide range of carrier concentration, diameter and thickness.

    GaSb material presents interesting properties for single junction thermophotovoltaic (TPV) devices. GaSb: Te single crystal grown with Czochralski (Cz) or modified Czo- chralski (Mo-Cz) methods are presented and the problem of Te homogeneity discussed. As the carrier mobility is one of the key points for the bulk crystal, Hall measurements are carried out. We present here some complementary developments based on the material processing point of view: the bulk crystal growth, the wafer preparation, and the wafer etching. Subsequent steps after these are related to the p / no r n/p junction elaboration. Some results obtained for different thin-layer elaboration approaches are presented. So from the simple vapor phase diffusion process or the liquid phase epitaxy process up to the metal organic chemical vapor deposition process we report some material specificity.

    Product Tags:

    gallium antimonide

      

    2 inch wafer

      
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