Sign In | Join Free | My burrillandco.com
Home > Laser Equipment Parts >

Off-Axis 4H N Type SiC Semiconductor Wafer, Research Grade,3”Size

    Buy cheap Off-Axis 4H N Type SiC Semiconductor Wafer, Research Grade,3”Size from wholesalers
     
    Buy cheap Off-Axis 4H N Type SiC Semiconductor Wafer, Research Grade,3”Size from wholesalers
    • Buy cheap Off-Axis 4H N Type SiC Semiconductor Wafer, Research Grade,3”Size from wholesalers

    Off-Axis 4H N Type SiC Semiconductor Wafer, Research Grade,3”Size

    Ask Lasest Price
    Brand Name : PAM-XIAMEN
    Price : By Case
    Payment Terms : T/T
    Supply Ability : 10,000 wafers/month
    Delivery Time : 5-50 working days
    • Product Details
    • Company Profile

    Off-Axis 4H N Type SiC Semiconductor Wafer, Research Grade,3”Size

    Off-Axis 4H N Type SiC Semiconductor Wafer, Research Grade,3”Size

    PAM-XIAMEN offers semiconductor silicon carbide wafers,6H SiC and 4H SiC in different quality grades for researcher and industry manufacturers. We has developed SiC crystal growth technology and SiC crystal wafer processing technology,established a production line to manufacturer SiCsubstrate,Which is applied in GaNepitaxydevice,powerdevices,high-temperature device and optoelectronic Devices. As a professional company invested by the leading manufacturers from the fields of advanced and high-tech material research and state institutes and China’s Semiconductor Lab,weare devoted to continuously improve the quality of currently substrates and develop large size substrates.


    Here shows detail specification:
    SILICON CARBIDE MATERIAL PROPERTIES

    PolytypeSingle Crystal 4HSingle Crystal 6H
    Lattice Parametersa=3.076 Åa=3.073 Å
    c=10.053 Åc=15.117 Å
    Stacking SequenceABCBABCACB
    Band-gap3.26 eV3.03 eV
    Density3.21 · 103 kg/m33.21 · 103 kg/m3
    Therm. Expansion Coefficient4-5×10-6/K4-5×10-6/K
    Refraction Indexno = 2.719no = 2.707
    ne = 2.777ne = 2.755
    Dielectric Constant9.69.66
    Thermal Conductivity490 W/mK490 W/mK
    Break-Down Electrical Field2-4 · 108 V/m2-4 · 108 V/m
    Saturation Drift Velocity2.0 · 105 m/s2.0 · 105 m/s
    Electron Mobility800 cm2/V·S400 cm2/V·S
    hole Mobility115 cm2/V·S90 cm2/V·S
    Mohs Hardness~9~9


    4H N Type SiC Semiconductor Wafer, Research Grade,3”Size

    SUBSTRATE PROPERTYS4H-51-SI-PWAM-250 S4H-51-SI-PWAM-330 S4H-51-SI-PWAM-430
    DescriptionResearch Grade 4H SEMI Substrate
    Polytype4H
    Diameter(50.8 ± 0.38) mm
    Thickness(250 ± 25) μm (330 ± 25) μm (430 ± 25) μm
    Resistivity (RT)>1E5 Ω·cm
    Surface Roughness< 0.5 nm (Si-face CMP Epi-ready); <1 nm (C- face Optical polish)
    FWHM<50 arcsec
    Micropipe DensityA+≤1cm-2 A≤10cm-2 B≤30cm-2 C≤50cm-2 D≤100cm-2
    Surface Orientation
    On axis <0001>± 0.5°
    Off axis 3.5° toward <11-20>± 0.5°
    Primary flat orientationParallel {1-100} ± 5°
    Primary flat length16.00 ± 1.70 mm
    Secondary flat orientation Si-face:90° cw. from orientation flat ± 5°
    C-face:90° ccw. from orientation flat ± 5°
    Secondary flat length8.00 ± 1.70 mm
    Surface FinishSingle or double face polished
    PackagingSingle wafer box or multi wafer box
    Usable area≥ 90 %
    Edge exclusion1 mm

    sic crystal defects

    Most of the defects which were observed in SiC were also observed in other crystalline materials. Like the dislocations,

    stacking faults (SFs), low angle boundaries (LABs) and twins. Some others appear in materials having the Zing- Blend or

    the Wurtzite structure, like the IDBs. Micropipes and inclusions from other phases mainly appear in SiC.
    High-Temperature Device Operation
    The wide bandgap energy and low intrinsic carrier concentration of SiC allow SiC to maintain
    semiconductor behavior at much higher temperatures than silicon, which in turn permits SiC semiconductor
    device functionality at much higher temperatures than silicon . As discussed in basic
    semiconductor electronic device physics textbooks, semiconductor electronic devices function
    in the temperature range where intrinsic carriers are negligible so that conductivity is controlled by
    intentionally introduced dopant impurities. Furthermore, the intrinsic carrier concentration
    is a fundamental prefactor to well-known equations governing undesired junction reverse-bias leakage
    currents. As temperature increases, intrinsic carriers increase exponentially so that undesired leakage
    currents grow unacceptably large, and eventually at still higher temperatures, the semiconductor
    device operation is overcome by uncontrolled conductivity as intrinsic carriers exceed intentional
    device dopings. Depending upon specific device design, the intrinsic carrier concentration of silicon
    generally confines silicon device operation to junction temperatures <300°C. SiC’s much smaller
    intrinsic carrier concentration theoretically permits device operation at junction temperatures exceeding
    800°C. 600°C SiC device operation has been experimentally demonstrated on a variety of
    SiC devices.
    The ability to place uncooled high-temperature semiconductor electronics directly into hot
    environments would enable important benefits to automotive, aerospace, and deep-well drilling
    industries. In the case of automotive and aerospace engines, improved electronic telemetry and
    control from high-temperature engine regions are necessary to more precisely control the combustion
    process to improve fuel efficiency while reducing polluting emissions. High-temperature capability
    eliminates performance, reliability, and weight penalties associated with liquid cooling, fans, thermal
    shielding, and longer wire runs needed to realize similar functionality in engines using conventional
    silicon semiconductor electronics.




























    Product Tags:

    silicon carbide wafer

      

    4h sic wafer

      
    Quality Off-Axis 4H N Type SiC Semiconductor Wafer, Research Grade,3”Size for sale
    • Haven't found right suppliers
    • Our buyer assistants can help you find the most suitable, 100% reliable suppliers from China.
    • And this service is free of charge.
    • we have buyer assistants who speak English, French, Spanish......and we are ready to help you anytime!
    Submit Buying Request
    Send your message to this supplier
    *From:
    Your email address is incorrect!
    *Subject:
    Your subject must be between 10-255 characters!
    *Message:
    For the best results, we recommend including the following details:
    • --Self introduction
    • --Required specifications
    • --Inquire about price/MOQ
    Your message must be between 20-3,000
    Yes! I would like your verified suppliers matching service!
    Send your message to this supplier
     
    *From:
    *To: XIAMEN POWERWAY ADVANCED MATERIAL CO., LTD.
    *Subject:
    *Message:
    Characters Remaining: (0/3000)
     
    Explore more SiC Wafer products from this supplier
    Find Similar Products By Category:
    Inquiry Cart 0