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4H N Type SiC Semiconductor Wafer, Dummy Grade,3”Size

    Buy cheap 4H N Type SiC Semiconductor Wafer, Dummy Grade,3”Size from wholesalers
     
    Buy cheap 4H N Type SiC Semiconductor Wafer, Dummy Grade,3”Size from wholesalers
    • Buy cheap 4H N Type SiC Semiconductor Wafer, Dummy Grade,3”Size from wholesalers

    4H N Type SiC Semiconductor Wafer, Dummy Grade,3”Size

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    Brand Name : PAM-XIAMEN
    Price : By Case
    Payment Terms : T/T
    Supply Ability : 10,000 wafers/month
    Delivery Time : 5-50 working days
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    4H N Type SiC Semiconductor Wafer, Dummy Grade,3”Size

    4H N Type SiC Semiconductor Wafer, Dummy Grade,3”Size

    PAM-XIAMEN offers semiconductor silicon carbide wafers,6H SiC and 4H SiC in different quality grades for researcher and industry manufacturers. We has developed SiC crystal growth technology and SiC crystal wafer processing technology,established a production line to manufacturer SiCsubstrate,Which is applied in GaNepitaxydevice,powerdevices,high-temperature device and optoelectronic Devices. As a professional company invested by the leading manufacturers from the fields of advanced and high-tech material research and state institutes and China’s Semiconductor Lab,weare devoted to continuously improve the quality of currently substrates and develop large size substrates.


    Here shows detail specification:

    SILICON CARBIDE MATERIAL PROPERTIES


    PolytypeSingle Crystal 4HSingle Crystal 6H
    Lattice Parametersa=3.076 Åa=3.073 Å
    c=10.053 Åc=15.117 Å
    Stacking SequenceABCBABCACB
    Band-gap3.26 eV3.03 eV
    Density3.21 · 103 kg/m33.21 · 103 kg/m3
    Therm. Expansion Coefficient4-5×10-6/K4-5×10-6/K
    Refraction Indexno = 2.719no = 2.707
    ne = 2.777ne = 2.755
    Dielectric Constant9.69.66
    Thermal Conductivity490 W/mK490 W/mK
    Break-Down Electrical Field2-4 · 108 V/m2-4 · 108 V/m
    Saturation Drift Velocity2.0 · 105 m/s2.0 · 105 m/s
    Electron Mobility800 cm2/V·S400 cm2/V·S
    hole Mobility115 cm2/V·S90 cm2/V·S
    Mohs Hardness~9~9

    4H N Type SiC Semiconductor Wafer, Dummy Grade,3”Size

    SUBSTRATE PROPERTYS4H-51-SI-PWAM-250 S4H-51-SI-PWAM-330 S4H-51-SI-PWAM-430
    DescriptionDummy Grade 4H SEMI Substrate
    Polytype4H
    Diameter(50.8 ± 0.38) mm
    Thickness(250 ± 25) μm (330 ± 25) μm (430 ± 25) μm
    Resistivity (RT)>1E5 Ω·cm
    Surface Roughness< 0.5 nm (Si-face CMP Epi-ready); <1 nm (C- face Optical polish)
    FWHM<50 arcsec
    Micropipe DensityA+≤1cm-2 A≤10cm-2 B≤30cm-2 C≤50cm-2 D≤100cm-2
    Surface Orientation
    On axis <0001>± 0.5°
    Off axis 3.5° toward <11-20>± 0.5°
    Primary flat orientationParallel {1-100} ± 5°
    Primary flat length16.00 ± 1.70 mm
    Secondary flat orientation Si-face:90° cw. from orientation flat ± 5°
    C-face:90° ccw. from orientation flat ± 5°
    Secondary flat length8.00 ± 1.70 mm
    Surface FinishSingle or double face polished
    PackagingSingle wafer box or multi wafer box
    Usable area≥ 90 %
    Edge exclusion1 mm

    SiC crystal growth

    Bulk crystal growth is the technique for fabrication of single crystalline substrates , making the base for further device processing.To have a breakthrough in SiC technology obviously we need production of SiC substrate with a reproducible process.6H- and 4H- SiC crystals are grown in graphite crucibles at high temperatures up to 2100—2500°C. The operating temperature in the crucible is provided either by inductive (RF) or resistive heating. The growth occurs on thin SiC seeds. The source represents polycrystalline SiC powder charge. The SiC vapor in the growth chamber mainly consists of three species, namely, Si, Si2C, and SiC2, which are diluted by carrier gas, for example, Argon. The SiC source evolution includes both time variation of porosity and granule diameter and graphitization of the powder granules.


    High-Power Device Operation

    The high breakdown field and high thermal conductivity of SiC coupled with high operational junction
    temperatures theoretically permit extremely high-power densities and efficiencies to be realized in SiC
    devices. The high breakdown field of SiC relative to silicon enables the blocking voltage region of a
    power device to be roughly 10×thinner and 10×heavier doped, permitting a roughly 100-fold
    beneficial decrease in the blocking region resistance at the same voltage rating. Significant energy
    losses in many silicon high-power system circuits, particularly hard-switching motor drive and power
    conversion circuits, arise from semiconductor switching energy loss . While the physics of
    semiconductor device switching loss are discussed in detail elsewhere, switching energy loss is
    often a function of the turn-off time of the semiconductor switching device, generally defined as the
    time lapse between application of a turn-off bias and the time when the device actually cuts off most
    of the current flow. In general, the faster a device turns off, the smaller its energy loss in a switched
    power conversion circuit. For device-topology reasons discussed in References 3,8, and 19–21, SiC’s
    high breakdown field and wide energy bandgap enable much faster power switching than is possible
    in comparably volt–ampere-rated silicon power-switching devices. The fact that high-voltage operation
    is achieved with much thinner blocking regions using SiC enables much faster switching (for comparable
    voltage rating) in both unipolar and bipolar power device structures. Therefore, SiC-based power
    converters could operate at higher switching frequencies with much greater efficiency (i.e., less switching
    energy loss). Higher switching frequency in power converters is highly desirable because it
    permits use of smaller capacitors, inductors, and transformers, which in turn can greatly reduce overall
    power converter size, weight, and cost.
    While SiC’s smaller on-resistance and faster switching helps minimize energy loss and heat generation,
    SiC’s higher thermal conductivity enables more efficient removal of waste heat energy from the active
    device. Because heat energy radiation efficiency increases greatly with increasing temperature difference
    between the device and the cooling ambient, SiC’s ability to operate at high junction temperatures permits
    much more efficient cooling to take place, so that heat sinks and other device-cooling hardware (i.e., fan
    cooling, liquid cooling, air conditioning, heat radiators, etc.) typically needed to keep high-power devices
    from overheating can be made much smaller or even eliminated.
    While the preceding discussion focused on high-power switching for power conversion, many of the
    same arguments can be applied to devices used to generate and amplify RF signals used in radar and
    communications applications. In particular, the high breakdown voltage and high thermal conductivity
    coupled with high carrier saturation velocity allow SiC microwave devices to handle much higher power
    densities than their silicon or GaAs RF counterparts, despite SiC’s disadvantage in low-field carrier
    mobility.

    Product Tags:

    4h sic wafer

      

    semi standard wafer

      
    Quality 4H N Type SiC Semiconductor Wafer, Dummy Grade,3”Size for sale
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