0.1Hz - 30Hz Atomic Force Microscope Nanoscale Scanning Probe Microscopes

Product Description:

The Atomic Force Microscope (AFM) is a cutting-edge tool that offers multi-mode measurement capabilities with nanometer resolution, making it an essential instrument for various research and industrial applications.

With a remarkable resolution of 0.04 nm, the AFM provides high-precision imaging and measurement of surface topography at the nanoscale level. This exceptional resolution allows researchers and scientists to explore and analyze samples with unprecedented detail and accuracy.

The AFM offers a versatile range of scanning modes, including Contact, Tapping, Non-contact, Lateral Force, and Force Modulation modes. This multifunctional capability enables users to adapt the AFM to different experimental requirements, allowing for comprehensive and detailed analysis of a wide range of samples.

Featuring a scanning range of 100 μm X 100 μm X 10μm, the AFM provides ample coverage for scanning large sample areas while maintaining high-resolution imaging capabilities. This scanning range allows for the examination of samples of varying sizes, up to 25 mm, ensuring flexibility in sample analysis and experimentation.

The AFM offers a scanning speed range of 0.1Hz to 30Hz, allowing users to adjust the scanning speed based on the specific requirements of their experiments. This flexibility in scanning speed ensures efficient data acquisition and analysis, enhancing the overall productivity and effectiveness of research and analysis processes.

In summary, the Atomic Force Microscope is a state-of-the-art instrument that combines multi-mode measurement capabilities, nanometer resolution, and multifunctional scanning modes to provide researchers and scientists with a powerful tool for exploring and analyzing samples at the nanoscale level. With its versatile scanning range, high-resolution imaging, and adjustable scanning speed, the AFM offers a comprehensive solution for a wide range of research and industrial applications.

Features:

• Product Name: Atomic Force Microscope
• Resolution: 0.04 Nm
• Scanning Speed: 0.1Hz-30Hz
• Sample Stage: Motorized XY Stage With 100 μm Resolution
• Scanning Range: 100 μm X 100 μm X 10μm
• Scanning Modes: Contact, Tapping, Non-contact, Lateral Force, Force Modulation

Technical Parameters:

Applications:

Truth Instruments presents the AtomEdge Pro Atomic Force Microscope, a cutting-edge tool designed for nanoscale imaging and nanoscale characterization in a variety of applications. With its origins in China, this advanced microscope offers unparalleled precision and versatility for a wide range of research and industrial scenarios.

The AtomEdge Pro features a scanning range of 100 μm x 100 μm x 10 μm, allowing users to explore samples with high resolution and accuracy. Equipped with a motorized XY stage with 100 μm resolution, this microscope enables precise positioning and scanning of samples for detailed analysis.

One of the key strengths of the AtomEdge Pro lies in its scanning modes, which include contact, tapping, non-contact, lateral force, and force modulation. This versatility allows researchers to adapt the microscope to different sample types and experimental requirements, making it ideal for nanoscale imaging and characterization.

Researchers can adjust the scanning speed of the AtomEdge Pro from 0.1Hz to 30Hz, providing flexibility to capture dynamic processes and fine details on the nanoscale level. The high resolution of 0.04 Nm ensures accurate measurements and imaging, essential for in-depth analysis of sample properties.

With its advanced capabilities and precision engineering, the Truth Instruments AtomEdge Pro Atomic Force Microscope is suitable for a wide range of product application occasions and scenarios. From materials science and semiconductor research to biological studies and surface analysis, this scanning probe microscope offers unmatched performance and reliability for demanding nanoscale investigations.