Product Description:
The Atomic Force Microscope (AFM) is a cutting-edge tool designed
for nanoscale electrical measurement and analysis. This advanced
instrument offers unparalleled capabilities in scanning and imaging
at the nanoscale level, making it an essential device for
researchers and scientists working in various fields.
Key Product Attributes:
- Scanning Range: 100 μm X 100 μm x 10 μm
- Noise Level in the Z Direction: 0.04 Nm
- Scanning Method: XYZ Three-axis Full Sample Scanning
- Nonlinearity: 0.02% in the XY Direction and 0.08% in the Z Direction
- Noise Level in the XY Direction: 0.4 Nm
The Atomic Force Microscope stands out with its exceptional
scanning range of 100 μm in the X and Y directions, and 10 μm in
the Z direction. This wide scanning range allows for detailed and
comprehensive imaging of samples at the nanoscale level, providing
researchers with valuable insights into surface characteristics and
properties.
With a noise level of only 0.04 Nm in the Z direction and 0.4 Nm in
the XY direction, the AFM ensures high precision and accuracy in
measurements, making it ideal for demanding applications that
require reliable data acquisition.
The AFM's scanning method employs XYZ three-axis full sample
scanning, enabling users to explore samples from multiple angles
and directions with ease. This versatile scanning approach
facilitates comprehensive analysis of sample surfaces, making it a
valuable tool for a wide range of research applications.
Furthermore, the AFM boasts excellent linearity, with only 0.02%
nonlinearity in the XY direction and 0.08% nonlinearity in the Z
direction. This high level of linearity ensures that measurements
and imaging results are highly accurate and reliable, allowing
researchers to confidently interpret their data.
In summary, the Atomic Force Microscope is an all-in-one AFM
solution that offers exceptional scanning capabilities, low noise
levels, precise scanning methods, and excellent linearity in both
the XY and Z directions. With its advanced features and
cutting-edge design, the AFM is a must-have tool for researchers
and scientists conducting nanoscale electrical measurements and
analysis.
Features:
- Product Name: Atomic Force Microscope
- Noise Level in The XY Direction: 0.4 Nm
- Nonlinearity: 0.02% In The XY Direction And 0.08% In The Z
Direction
- Scanning Rate: 0.1-30 Hz
- Sample Size: 25 Mm
- Scanning Method: XYZ Three-axis Full Sample Scanning
Technical Parameters:
| Scanning Range | 100 μm X100 μm x 10 μm |
| Nonlinearity | 0.02% in the XY direction and 0.08% in the Z direction |
| Noise Level in the Z Direction | 0.04 Nm |
| Scanning Method | XYZ Three-axis Full Sample Scanning |
| Noise Level in the XY Direction | 0.4 Nm |
| Sample Size | 25 mm |
| Scanning Rate | 0.1-30 Hz |
Applications:
Truth Instruments' Atomic Force Microscope (AFM) model AtomEdge Pro
is a state-of-the-art instrument designed to meet the high demands
of scientific research and industrial applications. Originating
from China, this advanced AFM offers precise measurements and
imaging capabilities for a wide range of applications.
The AtomEdge Pro is ideal for various product application occasions
and scenarios due to its exceptional features:
- Noise Level: With a noise level of 0.4 Nm in the XY direction, the AtomEdge Pro
ensures accurate and reliable measurements even in challenging
environments.
- Sample Size: Capable of handling samples up to 25 mm in size, this AFM
accommodates a wide range of specimen types for versatile testing.
- Nonlinearity: Offering precision, the AtomEdge Pro boasts low nonlinearity rates
of 0.02% in the XY direction and 0.08% in the Z direction, ensuring
consistent and accurate results.
- Scanning Rate: With a scanning rate ranging from 0.1 to 30 Hz, users can adjust
the speed based on the specific requirements of their experiments.
- Scanning Range: The scanning range of 100 μm x 100 μm x 10 μm provides detailed
imaging and measurement capabilities for a wide range of samples.
One of the standout features of the AtomEdge Pro is its ability to
operate in Tapping Mode, a popular technique in AFM that minimizes
sample damage and provides high-resolution images. This mode is
particularly useful in biological and soft material research where
gentle imaging is essential.
Whether in research laboratories, academic institutions, or
industrial settings, the AtomEdge Pro finds its application in
various scenarios:
- Material Science: Studying surface properties, morphology, and mechanical
characteristics of materials at the nanoscale.
- Biology: Imaging biological samples such as cells, proteins, and DNA with
high resolution and precision.
- Nanotechnology: Characterizing nanomaterials and nanostructures for research and
development purposes.
- Quality Control: Ensuring product quality by analyzing surface roughness, defects,
and other features at the micro and nanoscale.
With its advanced capabilities and precision engineering, the
AtomEdge Pro from Truth Instruments is a reliable and versatile
Scanning Force Microscope that caters to the diverse needs of
modern research and industry.
