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AFM for Precise Surface Analysis and Nanometer Scale Imaging in Scientific Research and Industrial Applications

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AFM for Precise Surface Analysis and Nanometer Scale Imaging in Scientific Research and Industrial Applications

Multi-Functional Atomic Force Microscope - AtomEdge Pro
Product Introduction

The AtomEdge Pro multi-functional atomic force microscope can perform three-dimensional scanning imaging on materials, electronic devices, biological samples, etc. It features multiple working modes such as contact, tap, and non-contact, providing users with more flexible and precise operation options. In addition, it integrates multiple functional modes such as magnetic force microscopy, electrostatic force microscopy, scanning Kelvin microscopy, and piezoelectric force microscopy, featuring strong stability and good scalability. In addition, functional modules can be flexibly customized according to user needs, providing targeted solutions for specific research fields and achieving an efficient detection platform with multiple uses in one machine.

Equipment Performance
IndexSpecification
Sample Size25 mm
Scanning MethodXYZ three-axis full sample scanning
Scanning Range100 μm×100 μm×10 μm
Scanning Rate0.1-30 Hz
Noise Level In The Z Direction0.04 nm
Nonlinearity0.15% in the XY direction and 1% in the Z direction
Image Sampling PointThe maximum resolution of the scanning probe image is 4096×4096
Working ModeContact mode, tap mode, phase imaging mode, lift mode, multi-directional scanning mode
Multifunctional MeasurementElectrostatic force microscope (EFM), scanning Kelvin microscope (KPFM), piezoelectric force microscope (PFM), magnetic force microscope (MFM), force curve
Applications

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