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Wafer-Level Atomic Force Microscoperoscope

    Buy cheap Wafer-Level Atomic Force Microscoperoscope from wholesalers
     
    Buy cheap Wafer-Level Atomic Force Microscoperoscope from wholesalers
    • Buy cheap Wafer-Level Atomic Force Microscoperoscope from wholesalers

    Wafer-Level Atomic Force Microscoperoscope

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    Brand Name : Truth Instruments
    Model Number : AtomEdge Pro
    Price : Price Negotiable | Contact us for a detailed quote
    Payment Terms : T/T
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    Wafer-Level Atomic Force Microscoperoscope

    Wafer-Level Atomic Force Microscope
    Product Model:

    AtomMax

    Product Overview:

    Using micro-cantilever probe structures, this instrument enables 3D morphology characterization of conductive, semiconductive, and insulating solid materials, achieving wafer-level large-sample morphology characterization. Combined with an optical image, the electrically driven sample positioning stage allows for 1 μm positioning accuracy within a 200 x 200 mm area. with fully automated operations for laser alignment, probe approach, and scanning parameter adjust.ments.

    Equipment Performance Specifications
    ParameterSpecification
    Sample SizeCompatible with 8-inch wafers and below
    Scanning RangeMaximum 100μm * 100μm * 910μm
    Scanning Angle0~360"
    ResolutionZ-axis closed-loop resolution 0.15 nm; X/Y closed-loop resolution 0.5 nm
    Scanning Probe XY Direction lmage ResolutionNot less than 32x32~4000x4000
    Operating ModesContact mode, tapping mode, phase imaging mode, lift mode, multi-directional scanning mode
    Multi-Function MeasurementEFM,KFM,PFM,MFM

    Application Cases

    • Potential of the Au-Ti strip electrode sheet
    • Scanning mode: KPFM (lift-mode)
    • Scanning range: 18μm * 18μmTitanium Film - Aluminum Titanate Film

    • Electrostatic force of the Au-Ti strip electrode sheet
    • Scanning mode: EFM (lift mode)
    • Scanning range: 18μm * 18μm

    • Magnetic domains in Fe-Ni thin films
    • Scanning mode: MFM (lift-mode)
    • Scanning range: 14μm * 14μm

    • PbTiO3-piezoelectric corresponding vertical amplitude image
    • Scanning mode: PFM (contact-mode)
    • Scanning range: 20μm * 20μm
    Co/Pt Thin Film
    • Co/Pt Thin Film
    • Scanning Mode: Magnetic Force Microscopy (MFM)
    • Scanning Range: 25 μm * 25 μm
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