High-Stability AtomEdge Pro AFM: 4096×4096 Resolution 3D Scanning + EFM/KPFM/PFM

Product Description:

The Atomic Force Microscope (AFM) is a cutting-edge instrument designed for high-precision surface analysis and nanoscale electrical measurement. Renowned for its versatility and advanced functionality, this AFM offers a comprehensive suite of features that make it an indispensable tool in both research and industrial applications. With a scanning rate adjustable between 0.1 and 30 Hz, users can tailor the imaging speed to suit a wide range of sample types and experimental requirements, ensuring optimal data quality and efficiency.

One of the standout characteristics of this Atomic Force Microscope is its exceptionally low noise level in the Z direction, measured at just 0.04 Nm. This ultra-low noise floor enables highly sensitive surface profiling and topographical imaging, capturing minute details at the nanoscale with remarkable clarity. Such precision is critical for applications requiring detailed surface morphology characterization, where even the slightest deviations can impact material properties or device performance.

The AFM supports multiple working modes, including Contact Mode, Tap Mode, Phase Imaging Mode, Lift Mode, and Multi-directional Scanning Mode. These diverse operational modes allow users to adapt the microscope’s functionality to a broad spectrum of sample types and experimental goals. Contact Mode is ideal for detailed surface mapping with direct probe-sample interaction, while Tap Mode minimizes sample damage by intermittently contacting the surface. Phase Imaging Mode provides contrast related to material properties such as adhesion and stiffness. Lift Mode facilitates non-contact measurements like Magnetic Force Microscopy, essential for investigating magnetic domains and interactions. Meanwhile, Multi-directional Scanning Mode enhances imaging versatility by enabling scans from different angles, improving data reliability and depth of analysis.

Designed to accommodate samples up to 25 mm in size, this AFM offers ample space for a variety of specimens, from thin films and microfabricated devices to biological samples and nanostructures. This flexibility makes it suitable for a wide range of scientific disciplines, including materials science, physics, chemistry, and biology.

Beyond surface topography, this Atomic Force Microscope excels in multifunctional measurement capabilities. It integrates advanced techniques such as Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Force Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), Magnetic Force Microscopy (MFM), and Force Curve measurements. These modalities extend the microscope’s utility far beyond traditional imaging, allowing researchers to probe electrical, magnetic, and piezoelectric properties at the nanoscale.

Magnetic Force Microscopy (MFM) is particularly noteworthy, enabling detailed visualization and analysis of magnetic domains and stray fields with nanoscale resolution. This is invaluable for developing magnetic storage media, spintronic devices, and studying fundamental magnetic phenomena. Similarly, Electrostatic Force Microscopy and Scanning Kelvin Probe Force Microscopy facilitate nanoscale electrical measurement, providing insights into surface potential variations, charge distribution, and local electronic properties. Piezoelectric Force Microscopy allows for the investigation of piezoelectric and ferroelectric materials, crucial for advancing sensors, actuators, and energy harvesting technologies.

In addition to imaging, the Force Curve measurement capability offers quantitative mechanical characterization by recording force-distance relationships between the probe and sample surface. This is essential for studying adhesion, elasticity, and other mechanical properties at the nanoscale, providing comprehensive surface analysis that bridges morphology with physical behavior.

In summary, this Atomic Force Microscope is a highly advanced, multifunctional instrument that combines precise topographical imaging with sophisticated electrical, magnetic, and mechanical property measurements. Its broad scanning rate range, low noise performance, multiple working modes, and support for various measurement techniques make it an ideal choice for researchers seeking detailed surface analysis and nanoscale electrical measurement. Whether investigating magnetic phenomena via Magnetic Force Microscopy or exploring complex surface interactions, this AFM delivers unparalleled performance and versatility for cutting-edge scientific exploration.

Features:

• Product Name: Atomic Force Microscope
• Nonlinearity: 0.15% in the XY direction and 1% in the Z direction
• Image Sampling Point: Maximum resolution of the scanning probe image is 4096*4096
• Sample Size: 25 mm
• Scanning Rate: 0.1-30 Hz
• Working Modes: Contact Mode, Tap Mode, Phase Imaging Mode, Lift Mode, Multi-directional Scanning Mode
• Supports Magnetic Force Microscopy for advanced surface property mapping
• Enables detailed surface property mapping and surface analysis

Technical Parameters:

Applications:

The Truth Instruments AtomEdge Pro, originating from China, is a state-of-the-art Atomic Force Microscope designed to serve as a versatile nanoscale characterization platform. This advanced instrument is ideal for a wide range of application occasions and scenarios where precise nanoscale measurement and imaging are critical. With its exceptional noise level in the Z direction of just 0.04 Nm and a scanning rate ranging from 0.1 to 30 Hz, the AtomEdge Pro ensures highly accurate and reliable data acquisition, making it indispensable in research and industrial environments.

In academic and industrial research laboratories, the AtomEdge Pro excels in providing detailed surface morphology analysis at the nanoscale. Its multifunctional measurement capabilities, including Electrostatic Force Microscope (EFM), Scanning Kelvin Probe Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), Magnetic Force Microscopy (MFM), and Force Curve measurements, allow researchers to investigate a wide variety of material properties. This makes it particularly suitable for applications in materials science, semiconductor research, nanotechnology development, and biomolecular studies.

The AtomEdge Pro’s working modes—Contact Mode, Tap Mode, Phase Imaging Mode, Lift Mode, and Multi-directional Scanning Mode—offer flexible operational options to accommodate different sample types and experimental requirements. For example, Magnetic Force Microscopy is widely used in magnetic material characterization and spintronics research, where understanding magnetic domain structures at the nanoscale is essential. Similarly, Piezoelectric Force Microscopy enables the study of ferroelectric materials and piezoelectric devices, critical in developing sensors and actuators.

With a maximum sample size of 25 mm, the AtomEdge Pro is capable of handling a variety of sample dimensions, from thin films to microfabricated devices. Its robust design and multifunctionality make it suitable for use in quality control laboratories, where thorough nanoscale inspection is required to ensure product consistency and performance. Furthermore, the instrument’s high sensitivity and low noise levels enable it to be used in delicate biological sample imaging, contributing to advances in life sciences and medical research.

Overall, the Truth Instruments AtomEdge Pro is an essential nanoscale characterization platform that supports diverse application scenarios ranging from academic research and industrial development to quality assurance and advanced material investigations. Its comprehensive features and multifunctional capabilities make it a powerful tool for scientists and engineers seeking to explore and manipulate materials at the nanoscale with precision and confidence.

Support and Services:

Our Atomic Force Microscope (AFM) product is backed by comprehensive technical support and services to ensure optimal performance and user satisfaction.

Technical Support:

Our dedicated support team provides expert assistance for installation, calibration, and troubleshooting. We offer remote diagnostics and guidance to help resolve issues quickly and minimize downtime.

Maintenance Services:

Regular maintenance packages are available to keep your AFM operating at peak efficiency. These include routine inspections, cleaning, software updates, and hardware calibration.

Training and Education:

We offer comprehensive training programs for new users and advanced workshops for experienced operators. Training sessions cover instrument operation, data analysis, and advanced techniques to maximize your AFM’s capabilities.

Software Support:

Continuous software updates are provided to enhance functionality and introduce new features. Our support team assists with software installation, upgrades, and troubleshooting.

Customization and Upgrades:

To meet specific research needs, we offer customization options and hardware upgrades. Our engineers work closely with customers to tailor solutions that enhance performance and expand capabilities.

Warranty and Repair:

The AFM comes with a comprehensive warranty covering parts and labor. In case of hardware issues, our repair services ensure fast turnaround times to minimize disruption.

Customer Satisfaction:

We are committed to providing exceptional service and support. Our customer care team is dedicated to ensuring your experience with our AFM product is successful and productive.

FAQ:

Q1: What is the brand and model of this Atomic Force Microscope?

A1: The Atomic Force Microscope is the AtomEdge Pro, manufactured by Truth Instruments.

Q2: Where is the AtomEdge Pro produced?

A2: The AtomEdge Pro is made in China.

Q3: What are the primary applications of the AtomEdge Pro Atomic Force Microscope?

A3: The AtomEdge Pro is used for nanoscale surface imaging, material characterization, and measuring surface properties in research and industrial settings.

Q4: What types of samples can be analyzed with the AtomEdge Pro?

A4: The AtomEdge Pro can analyze a wide variety of samples including biological specimens, polymers, semiconductors, and metals.

Q5: Does the AtomEdge Pro support multiple scanning modes?

A5: Yes, the AtomEdge Pro supports various scanning modes such as contact mode, tapping mode, and non-contact mode for versatile imaging capabilities.