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Basic-type Atomic Force Microscope

    Buy cheap Basic-type Atomic Force Microscope from wholesalers
     
    Buy cheap Basic-type Atomic Force Microscope from wholesalers
    • Buy cheap Basic-type Atomic Force Microscope from wholesalers

    Basic-type Atomic Force Microscope

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    Brand Name : Truth Instruments
    Model Number : AtomExplorer
    Certification : /
    Price : Price Negotiable | Contact us for a detailed quote
    Payment Terms : T/T
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    Basic-type Atomic Force Microscope

    Product Name

    Basic-type Atomic Force Microscope - AtomExplorer

    Product Introduction

    The AtomExplorer Basic-type Atomic Force Microscope delivers sub-nanometer resolution for observing material surface topography and texture. It captures fine structures and minute features on material surfaces across scales from nanometers to micrometers, providing detailed visual information on material, chip and other sample surface topography. This product also integrates Magnetic Force Microscopy (MFM), Electrostatic Force Microscopy (EFM), Kelvin Force Microscopy (KFM), and Atomic Force Microscopy (AFM). It offers high stability, excellent expandability, and customization services. As a high-precision topography characterization tool and a device for high-nanoscale magnetic and electrical measurements, it provides additional options and support for education, scientific research and industrial R&D.

    Equipment Performance
    ItemDetails
    Sample SizeΦ 25 mm
    Scanning MethodXYZ Three-Axis Full-Sample Scanning
    Scanning Range100 μm×100 μm×10 μm / 30 μm×30 μm×5 μm
    Z-Axis Noise Level0.04 nm
    Tip Protection TechnologySafe Needle Insertion Mode
    Image Sampling Points32×32-4096×4096
    Operating ModeTap Mode, Contact Mode,Lift Mode, Phase Imaging Mode
    Multifunctional MeasurementsElectrostatic Force Microscope (EFM), Scanning Kelvin Microscope (KPFM), Piezoelectric Force Microscope (PFM), Magnetic Force Microscope (MFM)

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