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Standard Test Finger Probe with 30±0.2 Jointed Point 80±0.2 Length and 180±0.2 Fingertip to Baffle for Accessibility Testing

    Buy cheap Standard Test Finger Probe with 30±0.2 Jointed Point 80±0.2 Length and 180±0.2 Fingertip to Baffle for Accessibility Testing from wholesalers
     
    Buy cheap Standard Test Finger Probe with 30±0.2 Jointed Point 80±0.2 Length and 180±0.2 Fingertip to Baffle for Accessibility Testing from wholesalers
    • Buy cheap Standard Test Finger Probe with 30±0.2 Jointed Point 80±0.2 Length and 180±0.2 Fingertip to Baffle for Accessibility Testing from wholesalers

    Standard Test Finger Probe with 30±0.2 Jointed Point 80±0.2 Length and 180±0.2 Fingertip to Baffle for Accessibility Testing

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    Brand Name : Pego Electronics
    Model Number : PG-TPB
    Certification : Third-Lab Calibration Certificate
    Price : Negotiation
    Payment Terms : T/T,PayPal
    Supply Ability : 1000pc/month
    Delivery Time : 3 working days
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    Standard Test Finger Probe with 30±0.2 Jointed Point 80±0.2 Length and 180±0.2 Fingertip to Baffle for Accessibility Testing

    Standard Test Finger for Accessiblity Test


    1. Introduction

    Standard test finger also be called as jointed test finger and test probe B, it is applied to simulate the human finger to verify the accessbility to hazardous parts of electrical and electronic devices. This probe is widely refered by IEC60335-1, IEC62368-1, IEC60598-1 and other products standards.

    Standard test finger is strictly designed according to IEC61032 figure 2, it consists by inslating handle and metal finger. During the test, 10N and 30N forces are requested to apply, so this probe is built-in 0-50N thruster. A wire is lead out to connect with electrical indicator to indicate the accessibility of hazardous live parts.


    2. Specification

    ModelPG-TPB
    Jointed point size 130±0.2
    Jointed point size 260±0.2
    Length of finger80±0.2
    Fingertip to baffle size180±0.2
    Fingertip taper filletS4±0.05
    Diameter of fingerФ12 0 -0.05
    Diameter of baffleФ75±0.2
    Thickness of baffle5±0.5
    A-A section diameterФ50
    A-A section widthФ20±0.2
    Thruster10N optional
    StandardIEC61032


    Quality Standard Test Finger Probe with 30±0.2 Jointed Point 80±0.2 Length and 180±0.2 Fingertip to Baffle for Accessibility Testing for sale
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